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Details, datasheet, quote on part number:AD53509JSQ
 
 
Part:AD53509JSQ
Description:High-performance Driver/comparator Active Load on a Single Chip
Company:Analog Devices
Datasheet:Download AD53509JSQ datasheet   File size : 113 kB
Request For quote:  Find where to buy AD53509JSQ
 



Datasheet text preview:
a
FEATURES 250 MHz Operation Driver/Comparator and Active Load Included On-Chip Schottky Diode Bridge 52-Lead LQFP Package with Built-In Heat Sink

High-Performance Driver/Comparator Active Load on a Single Chip AD53509
FUNCTIONAL BLOCK DIAGRAM
VCC VH 47 VTERM 45 DATA 37 DATA 38 IOD 43 IOD 42 RLD 49 RLD 50 VL 31 HCOMP LEH LEH QH QH COMPARATOR QL QL LEL LEL LCOMP ACTIVE LOAD VCOMI IOLC IOLRTN /I +1 VCOMS V DRIVER 46 VOUT VLDCPL VCC VCC VCC
51 52 34

VEE
39

VEE VEE VEE
40 41 32

39nF CHDCPL

APPLICATIONS Automatic Test Equipment Semiconductor Test Systems Board Test Systems Instrumentation and Characterization Equipment

AD53509
VHDCPL 39nF CLDCPL

PRODUCT DESCRIPTION

The AD53509 is a single chip that performs the pin electronics functions of driver, comparator and active load in ATE VLSI and memory testers. In addition, a Schottky diode bridge for the active load and a VCOM buffer are included internally. The driver is a proprietary design that features three active states: Data High Mode, Data Low Mode and Term Mode as well as an Inhibit State. This facilitates the implementation of high speed active termination. The output voltage range is ­2 V to +7 V to accommodate a wide variety of test devices. The output leakage is typically less than 250 nA over the entire signal range. The dual comparator, with an input range equal to the driver output range, features built-in latches and ECL-compatible outputs. The outputs are capable of driving 50 signal lines terminated to ­2 V. Signal tracking capability is upwards of 5 V/ns. The active load can be set for up to 40 mA load current with less than a 10 µA linearity error through the entire set range. IOH, IOL and the buffered VCOM are independently adjustable. On-board Schottky diodes provide high speed switching and low capacitance. Also included on the chip is an on-board temperature sensor whose purpose is to give an indication of the surface temperature of the DCL. This information can be used to measure JC and JA or flag an alarm if proper cooling is lost. Output from the sensor is a current sink that is proportional to absolute temperature. The gain is trimmed to a nominal value of 1.0 µA/K. As an example, the output current can be sensed by using a 10 k resistor connected from 10 V to the THERM (IOUT) pin. A voltage drop across the resistor will be developed that equals: 10K × 1 µA/K = 10 mV/K = 2.98 V at room temperature.

OUT_L IOHRTN INHL 36 INHL 35 IOHC V/I
9,33,44,46,48 2,5,8

THERM 1.0 A/K
14, 26 NC

PWRGND

VCCO

HQGND2

HQGND

NC = NO CONNECT

REV. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2000

AD53509­SPECIFICATIONS
DRIVER SPECIFICATIONS
(All specifications are at TJ = 85 C measured at TJ = 75 C to 95 C.)
Parameter

5 C, VS = 11 V
Min

3%, ­VS = ­6 V =
Typ Max

3% unless otherwise noted. All temperature coefficients are
Unit Test Conditions

DIFFERENTIAL INPUT CHARACTERISTICS (DATA to DATA, IOD to IOD, RLD to RLD) Input Voltage ­2 Differential Input Range Bias Current ­250 REFERENCE INPUTS Bias Currents OUTPUT CHARACTERISTICS Logic High Range Logic Low Range Amplitude (VH and VL) Absolute Accuracy VH Offset VH Gain + Linearity Error VL Offset VL Gain + Linearity Error Offset TC Output Resistance VH = ­2 V VH = +7 V VL = ­2 V VL = +6 V VH = +3 V Dynamic Current Limit Static Current Limit ­50 ­2 ­2 0.1 ­50 0.3 ­ 5 ­50 ­0.3 ­ 5 0.5

+3 2 +250 +50 +7 +6 9 +50 +0.3 + 5 +50 +0.3 + 5

V V µA µA V V V mV % of VH + mV mV % of VL + mV m V / °C mA mA

All Digital Inputs Within a 2 V Range VIN = ­2 V, +3 V V L , VH , V T = 5 V DATA = H, VH = ­2 V to +7 V, VL = ­2 V, VT = 0 V DATA = L, VL = ­2 V to +6 V, VH = 7 V, VT = 0 V VL = 0.0 V, VH = 0.1 V, VT = 0 V VL = ­2 V, VH = +7 V, VT = 0 V DATA = H, VH = 0 V, VL = ­2 V, VT = ­1 V DATA = H, VH = ­1 V to +7 V, VL = ­2 V, VT = ­2 V DATA = L, VL = 0 V, VH = 5 V, VT = 3 V DATA = L, VL = ­2 V to +6 V, VH = 7 V, VT = 7 V VL = ­2 V, VH = 0 V, VT = ­1 V (VH Offset) VL = 0 V, VH = 5 V, VT = 3 V (VL Offset) VL = ­2 V, VT = 0 V, IOUT = 0, +1, +30 mA VL = ­1 V, VT = 0 V, IOUT = 0, ­1, ­30 mA VH = 6 V, VT = 0 V, IOUT = 0, 1, 30 mA VH = 7 V, VT = 0 V, IOUT = 0, ­1, ­30 mA VL = 0 V, VT = 0 V, IOUT = ­30 mA (Trim Point) CBYP = 39 nF, VH = 6 V, VL = ­2 V, VT = 0 V Output to ­2 V, VH = 7 V, VL = ­1 V, VT = 0 V DATA = H and Output to 7 V, VH = 6 V, VL = ­2 V, VT = 0 V, DATA = L TERM MODE, VT = ­2 V to +7 V, VL = 0 V, VH = 3 V TERM MODE, VT = 0 V, VL = 0 V, VH = 3 V TERM MODE, VT = ­2 V to +7 V, VL = 0 V, VH = 3 V VT = 0 V, VL = 0 V, VH = 3 V IOUT = +30 mA, +1.0 mA, VT = ­2.0 V, VH = 3 V, VL = 0 V IOUT = ­30 mA, ­1.0 mA, VT = +7.0 V, VH = 3 V, VL = 0 V IOUT = ± 30 mA, ± 1.0 mA, VT = 0 V, VH = 3 V, VL = 0 V Measured at 50%, VH = +400 mV, VL = ­400 mV, VT = 0 V Measured at 50%, VH = +400 mV, VL = ­400 mV, VT = 0 V Measured at 50%, VH = +400 mV, VL = ­400 mV, VT = 0 V Measured 20%­80%, VL = 0 V, VH = 1 V, VT = 0 V Measured 20%­80%, VL = 0 V, VH = 3 V, VT = 0 V Measured 10%­90%, VL = 0 V, VH = 5 V, VT = 0 V Measured 10%­90%, VL = ­2 V, VH = 7 V, VT = 0 V Measured 20%­80%, VL = 0 V, VH = 1 V Measured 20%­80%, VL = 0 V, VH = 3 V Measured 10%­90%, VL = 0 V, VH = 5 V VL, VH = ­0.1 V, 0.1 V, VL, VH = 0.0 V, 1.0 V VL, VH = 0.0 V, 3.0 V, VL, VH = 0.0 V, 5.0 V VL, VH = ­2.0 V, 7.0 V VL = 0 V, VH = 0.5 V, VT = ­2 V VL = 0 V, VH = 0.5 V, VT = ­2 V

44 44 44 44

46 46 46 46 46 >100

48 48 48 48

­85

+85

V TE R M
Voltage Range VTERM Offset VTERM Gain + Linearity Error Offset TC Output Resistance ­2 ­50 ­0.3 +10 44 0.5 46 +7 V +50 mV +0.3 +10 % of VSET + mV m V / °C 49

DYNAMIC PERFORMANCE, (VH AND VL) Propagation Delay Time Propagation Delay TC Delay Matching, Edge to Edge Rise and Fall Times 1 V Swing 3 V Swing 5 V Swing 9 V Swing Rise and Fall Time Temperature Coefficient 1 V Swing 3 V Swing 5 V Swing Overshoot and Preshoot

1.5 2 <100

ns ps/°C ps

0.42 0.75 1.65 3.0 ±1 ±2 ±4 <3 + 50

ns ns ns ns ps/°C ps/°C ps/°C % of Step + mV

Settling Time to 15 mV to 4 mV

<50 <10

ns µs

­2­

REV. A

AD53509
Parameter Delay Change vs. Pulsewidth Minimum Pulsewidth 3 V Swing 5 V Swing Toggle Rate DYNAMIC PERFORMANCE, INHIBIT Delay Time, Active to Inhibit Delay Time, Inhibit to Active Delay Time Matching (Z) Min Typ 50 1.4 2.0 250 3.3 2.9 3.0 V p-p Measured at 50%, VH = +2 V, VL = ­2 V, VT = 0 V Measured at 50%, VH = +2 V, VL = ­2 V, VT = 0 V Z = Delay Time Active to Inhibit Test (Above)-- Delay Time Inhibit to Active Test (Above) (Of Worst Two Edges) VH = 0 V, VL = 0 V, VT = 0 V VH = +2 V, VL = ­2 V (Measured 20%/80% of 1 V Output) VH = +2 V, VL = ­2 V (Measured 20%/80% of 1 V Output) Measured at 50%, VL = ­1 V, VH = +1 V, VTERM = 0 V Measured at 50%, VL = VH = +0.4 V, VTERM = ­0.4 V VH/VL, VTERM = (0 V, ­1 V), (0 V, ­2.0 V), (0 V, 6.0 V) VL = ­2 V, VH = +2 V, VTERM = 0 V, 20%­80% VL = ­2 V, VH = +2 V, VTERM = 0 V, 20%­80% VS = VS ± 3%

I/O Spike Rise, Fall Time, Active to Inhibit Rise, Fall Time, Inhibit to Active DYNAMIC PERFORMANCE , VTERM Delay Time, VH to VTERM, VL to VTERM Delay Time, VTERM to VH and VTERM to VL Overshoot and Preshoot VTERM Mode Rise Time VTERM Mode Fall Time PSRR, DRIVE or TERM Mode
Specifications subject to change without notice.

150 1.6 1.4 2.5 2.5 <3.0 + 75 2.2 2.2 35

mV, p-p ns ns ns ns % of Step + mV ns ns dB

COMPARATOR SPECIFICATIONS
(All specifications are at TJ = 85 C 5 C. [Outputs terminated in 150 to GND, +VS = 11 V otherwise specified.] All temperatures coefficients are measured at TJ = 75 C to 95 C.)
Parameter DC INPUT CHARACTERISTICS Offset Voltage (VOS) Offset Voltage (Drift) HCOMP, LCOMP Bias Current Voltage Range (VCM) Differential Voltage (VDIFF) Gain and Linearity LATCH ENABLE INPUTS Logic "1" Current (IIH) Logic "0" Current (IIL) Logic Input Range DIGITAL OUTPUTS Logic "1" Voltage (VOH) Logic "0" Voltage (VOL) Slew Rate VCCO Range SWITCHING PERFORMANCE Propagation Delay Input to Output Latch Enable to Output Propagation Delay Temperature Coefficient Propagation Delay Change with Respect to Slew Rate: 0.5 V, 1.0 V, 3.0 V/ns Slew Rate: 5.0 V/ns Amplitude: 1.0 V, 3.0 V, 5.0 V Equivalent Input Rise Time Pulsewidth Linearity Settling Time Latch Timing Input Pulsewidth Setup Time Hold Time Hysteresis
Specifications subject to change without notice.

3% ­VS = 6 V

3%, VCCO = 3.3 V unless

Min ­25

Typ

Max +25

Unit mV µV/°C µA V V % FSR µA µA V V V V/ns V

Test Conditions CMV = 0 V CMV = 0 V V IN = 0 V

50 ­50 ­2 ­0.05 +50 +7.0 9.0 +0.05 250 ­250 ­2 VCCO ­ 0.98 VCCO ­ 1.5 1 0 8 +3

VIN = ­2 V to +7 V (9 V FSR) LEA, LEA, LEB, LEB = +3 V LEA, LEA, LEB, LEB = ­2 V

Q or Q, 16.7 mA Load Q or Q, 10 mA Load

1.8 2 2 <± 100 <± 350 <± 200 450 <± 200 25 1.68 1.0 1.1 6

ns ns p s / °C ps ps ps ps ps ns ns ns ns mV

VIN = 2 V p-p, HCOMP = 1 V, LCOMP = 1 V

VIN = 0 V to 5 V VIN = 0 V to 5 V VIN = 1.0 V/ns VIN = 0 V to 3 V, 3 V/ns VIN = 0 V to 3 V, 3 V/ns, PW = 3 ns­8 ns Settling to ± 8 mV, VIN = 1 V to 0 V

Latch Inputs Programmed for Hysteresis

REV. A

­3­

AD53509­SPECIFICATIONS
ACTIVE LOAD SPECIFICATIONS
(All specifications are at TJ = 85 C measured at TJ = 75 C to 95 C.)
Parameter INPUT CHARACTERISTICS INHL, INHL Input Voltage Bias Current IOHC Current Program Range IOH = 0 mA to ­40 mA IOLC Current Program Range IOL = 0 mA to +40 mA IOHC, IOLC Input Bias Current IOLRTN, IOHRTN Range VDUT Range VDUT Range, IOH = 0 mA to ­40 mA VDUT Range, IOL = 0 mA to +40 mA VCOMI Input Range OUTPUT CHARACTERISTICS Accuracy Absolute Accuracy Error, Load Current

5 C, +VS = 11 V
Min

3%, ­VS = ­6 V =
Typ Max

3% unless otherwise noted. All temperature coefficients are
Test Conditions

Unit

­2 ­250 0 0 ­300 ­2 ­2 ­0.7 ­2 ­2

+3 250 4 4 +300 +7 +7 +7 +5.7 +7

V µA V V µA V V V V V

IOHC = 1 V, IOLC = 1 V, VCOM = 2 V, OUT_L = 0 V INHL, INHL = ­2 V, +3 V OUT_L = ­0.7 V, +7 V OUT_L = ­2 V, +5.7 V IOLC = 0 V, 4.0 V and IOHC = 0 V, 4.0 V IOL = +40 mA, IOH = ­40 mA, OUT_L = ­2 V, +7 V IOL = +40 mA, IOH = ­40 mA, IOUT_L­VCOMI >1.3 V OUT_L ­VCOM > 1.3 V VCOM­VDUT > 1.3 V IOL = +40 mA, IOH = ­40 mA

­0.3 ­ 100

+0.3 + 100 % ISET + µA

IOL, IOH = 25 µA­40 mA, VCOM = 0 V, OUT_L = ± 2 V and IOL = 25 µA­40 mA, VCOM = +7 V, OUT_L = +5.7 V and IOH = 25 µA­40 mA, VCOM = ­2 V, OUT_L = ­0.7 V IOL, IOH = 40 mA, VCOMI = 0 V, OUT_L = VCOM VCOMI = 0 V, OUT_L = VCOM IOL, IOH = 40 mA, VCOMI = ­1 V to +6 V, VOUT = VCOM IOL, IOH = 40 mA, VCOMI = ­1 V to +6 V, VOUT = VCOM Measured at IOH, IOL = 200 µA

VCOM Buffer Offset Error Bias Current Gain Error Linearity Error Output Current TC DYNAMIC PERFORMANCE Propagation Delay ± IOUT to Inhibit Inhibit to ± IOUT Propagation Delay Matching I/O Spike Settling Time to 15 mV Settling Time to 4 mV
Specifications subject to change without notice.

­50 ­10 ­0.2 ­10

+1

+50 +10 +0.2 +10

mV µA % mV µA/°C

<± 2

1.9 2.8 <1.8 240 <50 <10

ns ns ns mV ns µs

VCOM = ± 2 V, IOL = +20 mA, IOH = ­20 mA VCOM = ± 2 V, IOL = +20 mA, IOH = 20 mA VCOM = 0 V, IOL = +20 mA, IOH = ­20 mA IOL = +20 mA, IOH = ­20 mA, 50 Load, to IOL = +20 mA, IOH = ­20 mA, 50 Load, to 15 mV 4 mV

­4­

REV. A

AD53509 TOTAL FUNCTION SPECIFICATIONS
(All specifications are at TJ = 85 C measured at TJ = 75 C to 95 C.)
Parameter OUTPUT CHARACTERISTICS Output Leakage Current, VOUT = ­1 V to +5 V Output Leakage Current, VOUT = ­2 V to +7 V Output Capacitance POWER SUPPLIES Total Supply Range Positive Supply Negative Supply Positive Supply Current Negative Supply Current VCCO Current Total Power Dissipation Temperature Sensor Gain Factor

5 C, VS = 11 V
Min

3%, ­VS = ­6 V =
Typ Max +250 +500 8 17 11 ­6 280 290 65 4.8 1

3% unless otherwise noted. All temperature coefficients are
Unit nA µA pF V V V mA mA mA W µA/K Test Conditions

­250 ­500

Driver and Load INHIBITED

Driver = INH, ILOAD Program = 40 mA, Load = Active Driver = INH, ILOAD Program = 40 mA, Load = Active VCCO = 3.3 V, Comparator Output 150 to GND Driver = INH, ILOAD Program = 40 mA, Load = Active RLOAD = 10 k, VSOURCE = 11 V

NOTES Connecting or shorting the decoupling pins to ground will result in the destruction of the device. Specifications subject to change without notice.

Table I. Driver Truth Table

DATA 0 1 X X

DATA 1 0 X X

IOD 1 1 0 0

IOD 0 0 1 1

RLD X X 0 1

RLD X X 1 0

OUTPUT STATE VL VH INH VTERM

Table II. Comparator Truth Table

VOUT >HCOMP >HCOMP LCOMP LCOMP
LEH 1 1 1 1 0

LEH 0 0 0 0 1

LEL 1 1 1 1 0

LEL 0 0 0 0 1

QH

OUTPUT STATES QH QL 0 0 1 1 QH (t ­ 1) 1 0 1 0 QL (t ­ 1)

QL 0 1 0 1 QL (t ­ 1)

1 1 0 0 QH (t ­ 1)

Table III. Active Load Truth Table

OUT_L VCOM X

INHL 0 0 1

INHL 1 1 0

IOH

OUTPUT STATES (Including Diode Bridge) IOL I(OUT_L) V(IOLC) × 10 mA V(IOLC) × 10 mA 0 IOL IOH 0

V(IOHC) × 10 mA V(IOHC) × 10 mA 0

REV. A

­5­