Details, datasheet, quote on part number: 5962-8751508LX
Part5962-8751508LX
CategoryMemory => ROM => PROM
Description
CompanyCypress Semiconductor Corp.
DatasheetDownload 5962-8751508LX datasheet
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Features, Applications

Features

CMOS for optimum speed/power Windowed for reprogrammability High speed 20 ns (Commercial) 25 ns (Military) Low power 660 mW (Commercial) 770 mW (Military) Super low standby power (7C261) Less than 220 mW when deselected Fast access: 20 ns EPROM technology 100% programmable Slim 300-mil or standard 600-mil packaging available 10% VCC, commercial and military Capable of withstanding greater than 2001V static discharge TTL-compatible I/O Direct replacement for bipolar PROMs the CY7C261 automatically powers down into a low-power standby mode. It is packaged a 300-mil-wide package. The CY7C263 and CY7C264 are packaged in 300-mil-wide and 600-mil-wide packages respectively, and do not power down when deselected. The reprogrammable packages are equipped with an erasure window; when exposed to UV light, these PROMs are erased and can then be reprogrammed. The memory cells utilize proven EPROM floating-gate technology and byte-wide intelligent programming algorithms. The CY7C261, CY7C263, and CY7C264 are plug-in replacements for bipolar devices and offer the advantages of lower power, superior performance and programming yield. The EPROM cell requires only 12.5V for the supervoltage and low current requirements allow for gang programming. The EPROM cells allow for each memory location to be tested 100%, as each location is written into, erased, and repeatedly exercised prior to encapsulation. Each PROM is also tested for AC performance to guarantee that after customer programming the product will meet DC and AC specification limits. Read is accomplished by placing an active LOW signal on CS. The contents of the memory location addressed by the address line (A0-A12) will become available on the output lines (O0-O7).

A12 O1 POWER DOWN (7C261) COLUMN ADDRESS O3 ADDRESS DECODER O4 O5 ROW ADDRESS PROGRAMMABLE ARRAY COLUMN MULTIPLEXER O7

7C263-20 7C264-20 Maximum Access Time Maximum Operating Current Maximum Standby Current (7C261 only) Commercial Military Commercial Military 7C263-55 7C264-55 Unit ns mA

(Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperatures.................................65C to+150C Ambient Temperature with Power Applied..............................................55C to+125C Supply Voltage to Ground Potential (Pin 24 to Pin to+7.0V DC Voltage Applied to Outputs in High Z State................................................ to+7.0V DC Input Voltage........................................... 7.0V DC Program Voltage (Pin 19 DIP, Pin 23 LCC)..............................................13.0V

Static Discharge Voltage............................................ >2001V (per MIL-STD-883, Method 3015) Latch-Up Current..................................................... mA UV Exposure................................................ 7258 Wsec/cm2

Notes: 1. The volatge on any input or I/O pin cannot exceed the power pin during power-up. TA is the "instant on" case temperature.

7C264-20, 25 Parameter VOH VOL VIH VIL IIX VCD IOZ IOS ICC ISB VPP IPP VIHP VILP Description Output HIGH Voltage Output HIGH Voltage Output LOW Voltage Output LOW Voltage Input HIGH Level Input LOW Level Input Current Input Diode Clamp Voltage Output Leakage Current Output Short Circuit Current[5] Power Supply Current Standby Supply Current (7C261) Programming Supply Voltage Programming Supply Current Input HIGH Programming Voltage Input LOW Programming Voltage 4.75 0.4 GND < VOUT < VCC Output Disabled Com'l Mil Com'l Mil Com'l Mil 12 GND < VIN < VCC Test Conditions VCC = Min., IOH 2.0 mA VCC = Min., IOH 4.0 mA VCC = Min., IOL (6 mA Mil) VCC = Min., IOL 16 mA Note A mA Note Min. 2.4 Max. 45, 55 Min. Max. Unit A

VCC = Max., VOUT = GND VCC = Max., f = Max. IOUT 0 mA VCC = Max., CS > VIH

Parameter CIN COUT Description Input Capacitance Output Capacitance Test Conditions = 1 MHz, VCC = 5.0V Max. 10 Unit pF

Notes: 3. See the last page of this specification for Group A subgroup testing information. 4. See the "Introduction to CMOS PROMs" section of the Cypress Data Book for general information on testing. 5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.]


 

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