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Details, datasheet, quote on part number:FQP19N20CTSTU
 
 
Part:FQP19N20CTSTU
Description:200V N-channel Advance Q-FET C-series
Company:Fairchild Semiconductor
Datasheet:Download FQP19N20CTSTU datasheet   File size : 1172 kB
Request For quote:  Find where to buy FQP19N20CTSTU
 



Datasheet text preview:
FQP19N20C/FQPF19N20C

QFET
FQP19N20C/FQPF19N20C
200V N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switching DC/DC converters, switch mode power supplies, DC-AC converters for uninterrupted power supplies and motor controls.

®

Features
· · · · · · 19.0A, 200V, RDS(on) = 0.17 @VGS = 10 V Low gate charge ( typical 40.5 nC) Low Crss ( typical 85 pF) Fast switching 100% avalanche tested Improved dv/dt capability

D



G GDS




TO-220
FQP Series

GD S

TO-220F
FQPF Series


S

Absolute Maximum Ratings
Symbol VDSS ID ID M VG S S EAS IA R EAR dv/dt PD T J, T S T G TL

TC = 25°C unless otherwise noted

Param e ter Drain-Source Voltage - Continuous (TC = 25°C) Drain Current - Continuous (TC = 100°C) Drain Current - Pulsed
(Note 1)

FQP19N20C 19.0 12.1 76.0

F QPF 19N20C 200 19. 0 * 12. 1 * 76. 0 * ± 30 433

Units V A A A V mJ A mJ V /ns W W /°C °C °C

Gate-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25°C)
(Note 2) (Note 1) (Note 1) (Note 3)

19.0 13.9 5.5 139 1.11 -55 to +150 300 43 0 .34

- Derate above 25°C Operating and Storage Temperature Range Maximum lead temperature for soldering purposes, 1/8" from case for 5 seconds

* Drain current limited by maximum junction temperature.

Thermal Characteristics
Symb ol RJC RJS RJA P a r a m et e r Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Typ. Thermal Resistance, Junction-to-Ambient FQP19N20C 0.9 0.5 62.5 FQPF19N20C 2.89 -62.5 Units °C/W °C/W °C/W

©2004 Fairchild Semiconductor Corporation

Rev. A, March 2004

FQP19N20C/FQPF19N20C

Electrical Characteristics
Symbol Parameter

TC = 25°C unless otherwise noted

Test Conditions

M in

Typ

M ax

Units

Off Characteristics
BVDSS BVDSS / TJ ID S S IG S S F IG S S R Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse VGS = 0 V, ID = 250 µA ID = 250 µA, Referenced to 25°C VDS = 200 V, VGS = 0 V VDS = 160 V, TC = 125°C VGS = 30 V, VDS = 0 V VGS = -30 V, VDS = 0 V 200 ------0.24 ------10 100 100 -100 V V/°C µA µA nA nA

On Characteristics
VGS(th) RDS(on) gF S Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance VDS = VGS, ID = 250 µA VGS = 10 V, ID = 9.5 A VDS = 40 V, ID = 9.5 A
(Note 4)

2.0 ---

-0.14 10.8

4. 0 0.17 --

V S

Dynamic Characteristics
Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance VDS = 25 V, VGS = 0 V, f = 1.0 MHz ---830 195 85 1080 255 110 pF pF pF

Switching Characteristics
td(on) tr td(off) tf Qg Qg s Qg d Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge VDS = 160 V, ID = 19.0 A, VGS = 10 V
(Note 4, 5)

VDD = 100 V, ID = 19.0 A, RG = 25
(Note 4, 5)

--------

15 150 135 115 40.5 6.0 22.5

40 310 280 240 53.0 ---

ns ns ns ns nC nC nC

Drain-Source Diode Characteristics and Maximum Ratings
IS IS M VSD trr Qr r Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current VGS = 0 V, IS = 19.0 A Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0 V, IS = 19.0 A, dIF / dt = 100 A/µs
(Note 4)

------

---208 1.63

19.0 76.0 1. 5 ---

A A V ns µC

Notes: 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L = 1.8mH, IAS = 19.0A, VDD = 50V, RG = 25 , Starting TJ = 25°C 3. ISD 19.0A, di/dt 300A/µs, VDD BVDSS, Starting TJ = 25°C 4. Pulse Test : Pulse width 300µs, Duty cycle 2% 5. Essentially independent of operating temperature

©2004 Fairchild Semiconductor Corporation

Rev. A, March 2004

FQP19N20C/FQPF19N20C

Typical Characteristics

ID, Drain Current [A]

ID, Drain Current [A]

10

1

VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 5.5 V 5.0 V Bottom : 4.5 V Top :

10

1

150 C

o

25 C
10
0

o

-55 C

o

10

0

Notes : 1. 250µ s Pulse Test 2. TC = 25
-1

10

10

0

10

1

10

-1

Notes : 1. VDS = 40V 2. 250µ s Pulse Test

2

4

6

8

10

VDS, Drain-Source Voltage [V]

VGS, Gate-Source Voltage [V]

Figure 1. On-Region Characteristics

Figure 2. Transfer Characteristics

0.8

RDS(ON) [ ], Drain-Source On-Resistance

0.6

IDR, Reverse Drain Current [A]

10

1

0.4

VGS = 10V

10

0

150

0.2

VGS = 20V
Note : TJ = 25

25
Notes : 1. VGS = 0V 2. 250µ s Pulse Test

0.0

0

10

20

30

40

50

60

10

-1

0.0

0.4

0.8

1.2

1.6

2.0

2.4

ID, Drain Current [A]

VSD, Source-Drain voltage [V]

Figure 3. On-Resistance Variation vs Drain Current and Gate Voltage

Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature

3000

2500

Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd

12

VGS, Gate-Source Voltage [V]

10

VDS = 40V VDS = 100V VDS = 160V

Capacitance [pF]

2000

8

Ciss
1500

Coss Crss
Notes : 1. VGS = 0 V 2. f = 1 MHz
0 1

6

1000

4

500

2
Note : ID = 19.0A

0 -1 10

10

10

0

0

10

20

30

40

50

VDS, Drain-Source Voltage [V]

QG, Total Gate Charge [nC]

Figure 5. Capacitance Characteristics

Figure 6. Gate Charge Characteristics

©2004 Fairchild Semiconductor Corporation

Rev. A, March 2004

FQP19N20C/FQPF19N20C

Typical Characteristics

(Continued)

1.2

3.0

BVDSS, (Normalized) Drain-Source Breakdown Voltage

1.1

RDS(ON), (Normalized) Drain-Source On-Resistance

2.5

2.0

1.0

1.5

1.0
Notes : 1. VGS = 10 V 2. ID = 9.5 A

0.9

Notes : 1. VGS = 0 V 2. ID = 250 µA

0.5

0.8 -100

-50

0

50

100
o

150

200

0.0 -100

-50

0

50

100
o

150

200

TJ, Junction Temperature [ C]

TJ, Junction Temperature [ C]

Figure 7. Breakdown Voltage Variation vs Temperature

Figure 8. On-Resistance Variation vs Temperature

Operation in This Area is Limited by R DS(on)

10

2

10

2

Operation in This Area is Limited by R DS(on)

ID, Drain Current [A]

1 ms
10
1

ID, Drain Current [A]

100 µs

10 µs 100 µs
10
1

10 ms DC

1 ms 10 ms DC

10

0

Notes :
1. TC = 25 C 2. TJ = 150 C 3. Single Pulse
o o

10

0

Notes :
1. TC = 25 C 2. TJ = 150 C 3. Single Pulse
o o

10

-1

10

0

10

1

10

2

10

-1

10

0

10

1

10

2

VDS, Drain-Source Voltage [V]

VDS, Drain-Source Voltage [V]

Figure 9-1. Maximum Safe Operating Area for FQP19N20C

Figure 9-2. Maximum Safe Operating Area for FQPF19N20C

20

15

ID, Drain Current [A]

10

5

0 25

50

75

100

125

150

TC, Case Temperature []

Figure 10. Maximum Drain Current vs Case Temperature

©2004 Fairchild Semiconductor Corporation

Rev. A, March 2004

FQP19N20C/FQPF19N20C

Typical Characteristics

(Continued)

10

0

ZJC(t), Thermal Response

D = 0 .5 0 .2
10
-1

0 .1 0 .0 5 0 .0 2 0 .0 1

N o te s : 1 . Z J C ( t ) = 0 . 9 0 /W M a x . 2 . D u ty F a c to r , D = t1/t2 3 . T JM - T C = P D M * Z JC ( t)

PDM
s in g le p u ls e

t1

10

-2

t2

10

-5

10

-4

10

-3

10

-2

10

-1

10

0

10

1

t 1 , S q u a r e W a v e P u ls e D u r a t io n [ s e c ]

Figure 11-1. Transient Thermal Response Curve for FQP19N20C

ZJC(t), Thermal Response

D = 0 .5
10
0

0 .2 0 .1 0 .0 5
10
-1

N o te s : 1 . Z J C ( t ) = 2 . 8 9 /W M a x . 2 . D u ty F a c to r , D = t1/t2 3 . T JM - T C = P D M * Z JC ( t)

0 .0 2 0 .0 1 s in g le p u ls e

PDM t1 t2
0 1

10

-2

10

-5

10

-4

10

-3

10

-2

10

-1

10

10

t 1 , S q u a r e W a v e P u l s e D u r a t i o n [s e c ]

Figure 11-2. Transient Thermal Response Curve for FQPF19N20C

©2004 Fairchild Semiconductor Corporation

Rev. A, March 2004