Details, datasheet, quote on part number: IDT54FCT139AT
PartIDT54FCT139AT
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Description
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT139AT datasheet
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Features, Applications
IDT54/74FCT139/A/C FAST CMOS DUAL 1-0F-4 DECODER WITH ENABLE
FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE

IDT54/74FCT139 equivalent to FASTTM speed IDT54/74FCT139A 35% faster than FAST IDT54/74FCT139C 45% faster than FAST Equivalent to FAST output drive over full temperature and voltage supply extremes IOL = 48mA (commercial) and 32mA (military) CMOS power levels (1mW typ. static) TTL input and output level compatible CMOS output level compatible Substantially lower input current levels than FAST (5A max.) JEDEC standard pinout for DIP and LCC Product available in Radiation Tolerant and Radiation Enhanced versions Military product compliant to MIL-STD-883, Class B

The IDT54/74FCT139/A/C are dual 1-of-4 decoders built using an advanced dual metal CMOS technology. These devices have two independent decoders, each of which accept two binary weighted inputs (A0-A1) and provide four mutually exclusive active LOW outputs (O0-O3). Each decoder has an active LOW enable (E). When E is HIGH, all outputs are forced HIGH.


The IDT logo is a registered trademark of Integrated Device Technology, Inc. FAST is a trademark of National Semiconductor Co.

Description Address Inputs Enable Input (Active LOW) Outputs (Active LOW)
NOTE: H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care

Symbol Rating VTERM(2) Terminal Voltage with Respect to GND VTERM(3) Terminal Voltage with Respect to GND TA Operating Temperature TBIAS Temperature Under Bias TSTG Storage Temperature PT Power Dissipation IOUT DC Output Current Commercial to +7.0 Military to +7.0 Unit V

Symbol Parameter(1) CIN Input Capacitance COUT Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF

NOTE: 2605 tbl 1. This parameter is measured at characterization but not tested.

NOTES: 2605 tbl 01 Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only.

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC 0.2V Commercial: to +70C, VCC 5%; Military: to +125C, VCC 10%

Symbol VIH VIL II L VIK IOS VOH Parameter Input HIGH Level Input LOW Level Input HIGH Current Input LOW Current Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Min., = 18mA VCC VO = GND VCC = 3V, VIN = VLC or VHC, IOH = 32A VCC = Min. VIN = VIH or VIL VOL Output LOW Voltage IOH = 300A IOH = 12mA MIL. IOH = 15mA COM'L. VCC = 3V, VIN = VLC or VHC, IOL = 300A VCC = Min. VIN = VIH or VIL IOL = 300A IOL = 32mA MIL. IOL = 48mA COM'L. Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC VI = GND Min. 2.0 60 VHC 0.7 120 VCC 4.3 GND 0.3 Max. VLC VLC(4) 0.5

NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. This parameter is guaranteed but not tested.


 

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