Details, datasheet, quote on part number: IDT54FCT151TCT
PartIDT54FCT151TCT
Category
Description
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT151TCT datasheet
  

 

Features, Applications

Std., A, and C speed grades Low input and output leakage 1A (max.) Extended commercial range to +85C CMOS power levels True TTL input and output compatibility VOH = 3.3V (typ.) VOL = 0.3V (typ.) High drive outputs (-15mA IOH, 48mA IOL) Power off disable outputs permit "live insertion" Meets or exceeds JEDEC standard 18 specifications Product available in Radiation Tolerant and Radiation Enhanced versions Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked) Available in DIP, SOIC, CERPACK and LCC packages

The IDT54/74FCT151T/AT/CT are high-speed 8-input multiplexers built using an advanced dual metal CMOS technology. They select one bit of data from up to eight sources under the control of three select inputs. Both assertion and negation outputs are provided. The IDT54/74FCT151T/AT/CT has a common Active-LOW enable (E) input. When E is LOW, data from one of eight inputs is routed to the complementary outputs according to the 3-bit code applied to the Select (S0-S2) inputs. A common application of the `FCT151 is data routing from one of eight sources.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

Symbol Description VTERM(2) Terminal Voltage with Respect to GND VTERM(3) Terminal Voltage with Respect to GND TSTG Storage Temperature I OUT DC Output Current Max. 0.5 to VCC to +120 Unit C mA

Description Data Inputs Selects Inputs Enable Input (Active LOW) Data Output Inverted Data Output

2635 lnk 01 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only.

Symbol Parameter(1) CIN Input Capacitance COUT Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. Unit pF 12

NOTE: 1. This parameter is measured at characterization but not tested.
NOTE: 2635 tbl H = HIGH Voltage Level, L = LOW Voltage Level, X = Don't care, Z = High Impedance.

Following Conditions Apply Unless Otherwise Specified: Commercial: to +85C, VCC 5%; Military: to +125C, VCC 10%

Symbol VIH VIL II L IOZH IOZL II VIK IOS VOH Input HIGH Current (4) Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Min., = 18mA VCC VO = GND VCC = Min. VIN = VIH or VIL IOH = 6mA MIL. IOH = 8mA COM'L. IOH = 12mA MIL. IOH = 15mA COM'L. VOL VH ICC Output LOW Voltage Input Hysteresis Quiescent Power Supply Current VCC = Max. VIN = GND or VCC = Min. VIN = VIH or VIL

Parameter Input HIGH Level Input LOW Level Input HIGH Current (4) Input LOW Current (4) High Impedance Output Current (4)

Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max. = 0.5V VCC = Max., VI = VCC (Max.)

NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. The test limit for this parameter = -55C.


 

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