Details, datasheet, quote on part number: 5962F9563002QXC
Part5962F9563002QXC
CategoryCommunication => DSL (Digital Subscriber Line) => DSL Analog Front Ends
DescriptionRad-hard 16 Channel CMOS Analog Multiplexer With High-z Analog Input Protection
CompanyIntersil Corporation
DatasheetDownload 5962F9563002QXC datasheet
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Features, Applications

Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection

The is a radiation hardened, monolithic 16 channel multiplexer constructed with the Intersil Rad-Hard Silicon Gate, bonded wafer, Dielectric Isolation process. It is designed to provide a high input impedance to the analog source if device power fails (open), or the analog signal voltage inadvertently exceeds the supply to ±35V, regardless of whether the device is powered on or off. Excellent for use in redundant applications, since the secondary device can be operated in a standby unpowered mode affording no additional power drain. More significantly, a very high impedance exists between the active and inactive devices preventing any interaction. One of sixteen channel selection is controlled a 4-bit binary address plus an Enable-Inhibit input which conveniently controls the ON/OFF operation of several multiplexers in a system. All inputs have electrostatic discharge protection. The HS-1840ARH is processed and screened in full compliance with MIL-PRF-38535 and QML standards. The device is available a 28 lead SBDIP and a 28 lead Ceramic Flatpack. Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers listed here must be used when ordering. Detailed Electrical Specifications for these devices are contained in SMD 5962-95630. A "hot-link" is provided on our homepage for downloading. http://www.intersil.com/spacedefense/space.htm

Features

Electrically Screened to SMD # 5962-95630 QML Qualified per MIL-PRF-38535 Requirements Pin-to-Pin for Intersil's HS-1840RH and HS-1840/883S Improved Radiation Performance - Gamma Dose x 105RAD(Si) Improved rDS(ON) Linearity Improved Access Time 1.5µs (Max) Over Temp and Post Rad High Analog Input Impedance 500M During Power Loss (Open) ±35V Input Over Voltage Protection (Power On or Off) Dielectrically Isolated Device Islands Excellent in Hi-Rel Redundant Systems Break-Before-Make Switching No Latch-Up

ORDERING NUMBER 5962F9563002VXC 5962F9563002VYC INTERNAL MKT. NUMBER HS1-1840ARH-Q HS9-1840ARH-Q TEMP. RANGE (oC) to 125

CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 321-724-7143 | Copyright © Intersil Corporation 1999

NOTES: VS+ +15.5V ±0.5V, VS- ±10%, 1 each per socket, minimum. 1N4002, 1 each per board, minimum. Input Signals: square wave, 50% duty cycle, to 15V peak = F1/16. FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT NOTES: 1. The above test circuits are utilized for all package types. 2. The Dynamic Test Circuit is utilized for all life testing.

NOTES: = 0.01µF minimum, 1 each per socket, minimum. VS+ 15.5V ±0.5V, VS- 15.5 ±0.5V. FIGURE 2. STATIC BURN-IN TEST CIRCUIT

NOTE: 3. All irradiation testing is performed in the 28 lead CERDIP package.

 

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