Details, datasheet, quote on part number: HA-2557
DescriptionWideband Four Quadrant Analog Multiplier (current Output)
CompanyIntersil Corporation
DatasheetDownload HA-2557 datasheet
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Features, Applications

Wideband Four Quadrant Analog Multiplier (Current Output)

The is a monolithic, high speed, four quadrant, analog multiplier constructed in Intersil' Dielectrically Isolated High Frequency Process. The single-ended current output of the HA-2557/883 has a 130MHz signal bandwidth (RL = 50). High bandwidth and low distortion make this part an ideal component in video systems. The suitability for precision video applications is demonstrated further by low multiplication error (1.5%), low feedthrough (-52dB), and differential inputs with low bias currents (8A). The HA-2557/883 is also well suited for mixer circuits as well as AGC applications for sonar, radar, and medical imaging equipment. The current output of the HA-2557/883 allows it to achieve higher bandwidths than voltage output multipliers. Full scale output current is trimmed 1.6mA. An internal 2500 feedback resistor is also provided to accurately convert the current, if desired, to a full scale output voltage of 4V. The HA-2557/883 is not limited to multiplication applications only; frequency doubling, power detection, as well as many other configurations are also possible.


This Circuit is Processed in Accordance to MIL-STD883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1. Low Multiplication Error. 1.5% (Typ) Input Bias Currents. 8A (Typ) Signal Input Feedthrough 5MHz. -52dB (Typ) Wide Y Channel Bandwidth. 130MHz (Typ) Wide X Channel Bandwidth. 75MHz (Typ) Rise Time (RL 50). 7ns (Typ) Supply Current. 17mA (Max)


Military Avionics Missile Guidance Systems Medical Imaging Displays Video Mixers Sonar AGC Processors Radar Signal Conditioning Voltage Controlled Amplifier Vector Generator


CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 407-727-9207 | Copyright Intersil Corporation 1999

Voltage Between V+ and V-. 35V Differential Input Voltage. 6V Output Current. 3mA ESD Rating. < 2000V Lead Temperature (Soldering 10s). +300oC Storage Temperature Range. TA +150oC Max Junction Temperature. +175oC

Thermal Resistance JA JC CerDIP Package. 82oC/W 27oC/W Maximum Package Power Dissipation at +75oC CerDIP Package. 1.22W Package Power Dissipation Derating Factor above +75oC CerDIP Package. 12mW/oC

CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

Operating Supply Voltage (VS). 15V Operating Temperature Range. TA +125oC

TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: VSUPPLY 15V, RZ (Pin 10) not connected, Unless Otherwise Specified. PARAMETERS Multiplication Error SYMBOL ME CONDITIONS VY, = 1.6mA VY, = 4V Nominal 2500 VX, = 4V VXCM = 4V VYCM = 4V VX, = 0V VOUT = 10V GROUP A SUBGROUPS IOUT Offset Input Offset Voltage (VX) Input Bias Current (VX) Input Offset Current (VX) Common Mode (VX) Rejection Ratio Power Supply (VX) Rejection Ratio IOO VXIO IB(VX) IIO(VX) CMRR(VX) + PSRR(VX) - PSRR(VX) Input Offset Voltage (VY) Input Bias Current (VY) Input Offset Current (VY) Common Mode (VY) Rejection Ratio Power Supply (VY) Rejection Ratio VYIO IB(VY) IIO(VY) CMRR(VY) + PSRR(VY) - PSRR(VY) Supply Current ICC ZOUT Output Impedance 1 LIMITS TEMPERATURE -55 C

Table 2 Intentionally Left Blank. See AC Specifications in Table 3

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: VSUPPLY 15V, RZ (Pin 10) not connected, Unless Otherwise Specified. LIMITS PARAMETERS VY, CHARACTERISTICS Bandwidth AC Feedthrough BW(VY) VISO VX = Nulled to +4V Step to 90% pts to +4V Step 90 -48 MHz dB SYMBOL CONDITIONS NOTES TEMPERATURE MIN MAX UNITS

Overshoot Differential Input Resistance VX CHARACTERISTICS Bandwidth AC Feedthrough
Rise and Fall Time Overshoot Differential Input Resistance NOTE:

1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple production runs which reflect lot to lot and within lot variation. 2. Offset voltage applied to minimize feedthrough signal. TABLE 4. ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS Interim Electrical Parameters (Pre Burn-In) Final Electrical Test Parameters Group A Test Requirements Groups C and D Endpoints NOTE: 1. PDA applies to Subgroup 1 only. SUBGROUPS (SEE TABLE 1) 1 (Note


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