Details, datasheet, quote on part number: HA4-2546/883
DescriptionWideband Two Quadrant Analog Multiplier (voltage Output)
CompanyIntersil Corporation
DatasheetDownload HA4-2546/883 datasheet
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Features, Applications

Wideband Two Quadrant Analog Multiplier (Voltage Output)

The is a monolithic, high speed, two quadrant, analog multiplier constructed in the Intersil Dielectrically Isolated High Frequency Process. The HA-2546/883 has a voltage output with a 30MHz signal bandwidth, 300V/s slew rate and a 17MHz control input bandwidth. High bandwidth and slew rate make this part an ideal component for use in video systems. The suitability for precision video applications is demonstrated further by the 0.1dB gain flatness 5MHz, 1.6% multiplication error, -52dB feedthrough and differential inputs with 1.2A bias currents. The HA-2546/883 also has low differential gain (0.1% typ.) and phase (0.1o typ.) errors. The HA-2546/883 is well suited for AGC circuits as well as mixer applications for sonar, radar, and medical imaging equipment. The voltage output of the HA-2546/883 simplifies many designs by eliminating the current-to-voltage conversion stage required for current output multipliers.


This Circuit is Processed in Accordance to MIL-STD883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1. High Speed Voltage Output. 300V/s (Min) Low Multiplication Error.3.0% (Max) 1.6% (Typ) Input Bias Currents. 5A (Max) 1.2A (Typ) Signal Input Feedthrough. -52dB (Typ) Wide Signal Bandwidth. 30MHz (Typ) Wide Control Bandwidth. 17MHz (Typ) Gain Flatness 5MHz. 0.10dB (Typ)


Military Avionics Missile Guidance Systems Medical Imaging Displays Video Mixers Sonar AGC Processors

PART NUMBER HA1-2546/883 HA4-2546/883 TEMPERATURE RANGE to +125oC PACKAGE 16 Lead CerDIP 20 Lead Ceramic LCC

Radar Signal Conditioning Voltage Controlled Amplifier Vector Generator

CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 407-727-9207 | Copyright Intersil Corporation 1999

Voltage Between V+ and V-. 35V Differential Input Voltage. 6V Output Current. 60mA Junction Temperature. +175oC Storage Temperature Range. TA +150oC ESD Rating. <2000V Lead Temperature (Soldering 10s). +300oC

Thermal Resistance JA JC CerDIP Package. 80oC/W 25oC/W Ceramic LCC. 61oC/W 12oC/W Maximum Package Power Dissipation CerDIP Package +75oC. 1.25W Ceramic LCC Package +75oC. 1.64W Package Power Dissipation Derating Factor above +75oC CerDIP Package. 12mW/oC Ceramic LCC Package. 16mW/oC

CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

Operating Temperature Range. to +125oC Operating Supply Voltage. to 15V

TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: VSUPPLY = 15V, RLOAD 1k , CLOAD = 50pF, Unless Otherwise Specified. GROUP A SUBGROU 2, 3 Scale Factor Error Common Mode Range SF +CMR -CMR Input Offset Voltage (VY) Input Bias Current (VY) Input Offset Current (VY) Common Mode (VY) Rejection Ratio VIO(VY) IB(VY) IIO(VY) +CMRR(VY) -CMRR(VY) Input Offset Voltage (VX) Input Bias Current (VX) Input Offset Current (VX) Input Offset Voltage (VZ) Output Voltage Swing VIO(VX) IB(VX) IIO(VX) VIO(VZ) +VOUT -VOUT Output Current +IOUT -IOUT VCM = 0V VCM = 0V VCM = +2V VCM = 0V VCM = 0V VCM = +2.5V LIMITS TEMPERATURE +125oC, -55oC


TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS Table 2 Intentionally Left Blank. See AC Specifications in Table 3.

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: VSUPPLY = 15V, RLOAD = 1k, CLOAD = 50pF, Unless Otherwise Specified. LIMITS PARAMETER Slew Rate SYMBOL +SR CONDITIONS VOUT = 2VDC VOUT = 2VDC VOUT = 2VDC VOUT = 2VDC VOUT = 2VDC VOUT = 2VDC VPEAK = 2VDC NOTES 1 -SR 1 Rise and Fall Time TR NOTES: 1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple production runs which reflect lot to lot and within lot variation. 2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2VPEAK). 3. Measured between 10% and 90% points. TABLE 4. ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS Interim Electrical Parameters (Pre Burn-in) Final Electrical Test Parameters Group A Test Requirements Groups C and D Endpoints NOTE: 1. PDA applies to Subgroup 1 only. SUBGROUPS (SEE TABLE 1 1(Note TEMPERATURE +125oC, -55oC


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