Details, datasheet, quote on part number: RH1009
CategoryPower Management => Voltage References => 2.5V
Description2.5V Reference
CompanyLinear Technology Corporation
DatasheetDownload RH1009 datasheet
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Features, Applications

The is a general purpose 2.5V shunt regulator diode designed to operate over a wide current range while maintaining good stability with time and temperature. The adjust terminal allows either temperature coefficient to be minimized or the reference voltage to be adjusted without changing the temperature coefficient. Because it operates as a shunt regulator it can be used equally well as a positive or negative reference. The wafer lots are processed to Linear Technology's inhouse Class S flow to yield circuits usable in stringent military applications.

Reverse Breakdown Current................................ 20mA Forward Current................................................... 10mA Operating Temperature Range............. to 125C Storage Temperature Range................. to 150C Lead Temperature (Soldering, 10 sec).................. 300C

SYMBOL PARAMETER rZ VZ Time Reverse Breakdown Voltage Reverse Breakdown Voltage Change with Current Reverse Dynamic Impedance Temperature Stability Long Term Stability = 1mA CONDITIONS 1mA 1 NOTES MIN 2.495

Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights.

Reverse Breakdown Voltage IR 10mA Change with Current Reverse Dynamic Impedance 1mA 1
Note 1: Guaranteed by design, characterization or correlation to other tested parameters.

MIL-STD-883 TEST REQUIREMENTS Final Electrical Test Requirements (Method 5004) Group A Test Requirements (Method 5005) Group C and D End Point Electrical Parameters (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. SUBGROUP 1,2,3 1 PDA Test Notes The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burnin in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given.


1630 McCarthy Blvd., Milpitas, (408) 432-1900 FAX: (408) 434-0507q TELEX: 499-3977 q

Reverse Breakdown Voltage Change with Current


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