Details, datasheet, quote on part number: RH1021-5
PartRH1021-5
CategoryPower Management => Voltage References => 5.0V
Title5.0V
DescriptionPrecision 5V Reference
CompanyLinear Technology Corporation
DatasheetDownload RH1021-5 datasheet
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Features, Applications

DESCRIPTION

The is a precision 5V reference with ultralow drift and noise, extremely good long term stability and almost total immunity to input voltage variations. The reference output will source and sink to 10mA. Unique circuit design makes the RH1021-5 the first IC reference to offer ultralow drift without the use of high power onchip heaters. The wafer lots are processed to Linear Technology's inhouse Class S flow to yield circuits usable in stringent military applications.

Input Voltage........................................................... 40V Input/Output Voltage Differential............................. 35V Trim Pin-to-Ground Voltage Positive................................................ Equal to VOUT Negative........................................................... 20V Output Short-Circuit Duration VIN 35V........................................................ 10 sec VIN 20V................................................... Indefinite Operating Temperature Range.............. to 125C Storage Temperature Range................. to 150C Lead Temperature (Soldering, 10 sec).................. 300C

* Connected internally. Do not connect external circuitry to these pins.

SYMBOL PARAMETER VOUT TCVOUT V OUT IN V OUT I OUT Output Voltage Output Voltage Temperature Coefficient Line Regulation Load Regulation (Sourcing Current) Load Regulation (Sinking Current) IS Supply Current Output Voltage Noise Long Term Stability of VOUT Temperature Hysteresis of VOUT = 1000 Hrs Noncumulative 25 Hrs CONDITIONS 0 I OUT 0 I OUT 10mA NOTES

UNITS V ppm/C ppm/V ppm/mA mA VP-P VRMS ppm

SYMBOL PARAMETER VOUT TCVOUT V OUT IN V OUT I OUT Output Voltage Output Voltage Temperature Coefficient Line Regulation Load Regulation (Sourcing Current) Load Regulation (Sinking Current) IS Supply Current CONDITIONS 0 I OUT 0 I OUT 10mA 10Krad(Si) NOTES MIN MAX

Note 1: Output voltage is measured immediately after turn-on. Changes due to chip warm-up are typically less than 0.005%. Note 2: Temperature coefficient is measured by dividing the change in output voltage over the temperature range by the change in temperature. Separate tests are done for hot and cold; TMIN to 25C and 25C to TMAX. Incremental slope is also measured at 25C. Note 3: Line and load regulation are measured on a pulse basis. Output changes due to die temperature change must be taken into account separately. Package thermal resistance is 150C/W for the TO-5 (H) package. Note 4: RMS noise is measured with a 2-pole highpass filter at 10Hz and a 2-pole lowpass filter at 1kHz. The resulting output is full wave rectified and

then integrated for a fixed period, making the final reading an average as opposed to RMS. Correction factors are used to convert from average to RMS and to correct for the nonideal bandpass of the filters. Peak-to-peak noise is measured with a single highpass filter at 0.1Hz and a 2-pole lowpass filter at 10Hz. The unit is enclosed in a still-air environment to eliminate thermocouple effects on the leads. Test time is 10 seconds. Note 5: Consult factory for units with long term stability data. Note 6: VIN = 10V, IOUT = 25C, unless otherwise noted. Note 7: IOUT(MAX) (Sourcing) is 5mA for exposures greater than 100Krad (Si). Note 8: VIN = 10V, IOUT = 0, unless otherwise noted.

MIL-STD-883 TEST REQUIREMENTS Final Electrical Test Requirements (Method 5004) Group A Test Requirements (Method 5005) Group B and D for Class S, and Group C and D for Class B End Point Electrical Parameters (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. SUBGROUP 1,2,3,4 1 PDA Test Notes The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method of MIL-STD-883. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given.

Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights.


 

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