|Description||Precision 7V Reference|
|Company||Linear Technology Corporation|
|Datasheet||Download RH1021DM-7 datasheet
The is a precision 7V reference with ultralow drift and noise, extremely good long-term stability and almost total immunity to input voltage variations. The reference output will source and sink to 10mA. This reference can also be used as a shunt regulator (2-terminal Zener). Unique circuit design makes the RH1021-7 the first IC reference to offer ultralow drift without the use of high power on-chip heaters. The wafer lots are processed to Linear Technology's inhouse Class S flow to yield circuits usable in stringent military applications.
Input Voltage........................................................... 40V Input/Output Voltage Differential............................. 35V Output to Ground Voltage (Shunt Mode Current Limit)............................... 10V Output Short-Circuit Duration VIN 35V........................................................ 10 sec VIN 20V................................................... Indefinite Operating Temperature Range.............. to 125°C Storage Temperature Range................. to 150°C Lead Temperature (Soldering, 10 sec).................. 300°C* Connected internally. Do not connect external circuitry to these pins.
SYMBOL PARAMETER VOUT TCVOUT V OUT IN V OUT I OUT Output Voltage Output Voltage Temperature Coefficient Line Regulation Load Regulation (Sourcing Current) Load Regulation (Shunt Mode) IS IMIN Supply Current (Series Mode) Minimum Current (Shunt Mode) VIN Is Open Output Voltage Noise Long-Term Stability of VOUT Temperature Hysteresis of VOUT = 1000 Hrs Noncumulative 0 I OUT 1.2mA I OUT 10mA CONDITIONS NOTESUNITS V ppm/°C ppm/V ppm/mA mA µVP-P µVRMS ppm
SYMBOL PARAMETER VOUT TCVOUT V OUT IN V OUT I OUT Output Voltage Output Voltage Temperature Coefficient Line Regulation Load Regulation (Sourcing Current) Load Regulation (Shunt Mode) IMIN IS Minimum Current (Shunt Mode) Supply Current (Series Mode) 0 I OUT 1.2mA I OUT 10mA VIN Is Open CONDITIONS 10Krad(Si) NOTES MIN MAX
Note 1: Output voltage is measured immediately after turn-on. Changes due to chip warm-up are typically less than 0.005%. Note 2: Temperature coefficient is measured by dividing the change in output voltage over the temperature range by the change in temperature. Separate tests are done for hot and cold; TMIN to 25°C and 25°C to TMAX. Incremental slope is also measured at 25°C. Note 3: Line and load regulation are measured on a pulse basis. Output changes due to die temperature change must be taken into account separately. Package thermal resistance is 150°C/W for the TO-5 (H) package. Note 4: Shunt mode regulation is measured with the input open. With the input connected, shunt mode current can be reduced to 0mA. Load regulation will remain the same. Note 5: RMS noise is measured with a 2-pole highpass filter at 10Hz and a 2-pole lowpass filter at 1kHz. The resulting output is full wave rectified and then integrated for a fixed period, making the final reading an average as opposed to RMS. Correction factors are used to convert from average to RMS and to correct for the nonideal bandpass of the filters. Peak-to-peak noise is measured with a single highpass filter at 0.1Hz and a 2-pole lowpass filter at 10Hz. The unit is enclosed in a still-air environment to eliminate thermocouple effects on the leads. Test time is 10 seconds. Note 6: Consult factory for units with long term stability data. Note 7: VIN = 12V, IOUT = 25°C, unless otherwise noted. Note 8: IOUT(MAX) (Sourcing) is 5mA for exposures greater than 100Krad (Si). Note 9: VIN = 12V, IOUT = 0, unless otherwise noted.
MIL-STD-883 TEST REQUIREMENTS Final Electrical Test Requirements (Method 5004) Group A Test Requirements (Method 5005) Group B and D for Class S, and Group C and D for Class B End Point Electrical Parameters (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. SUBGROUP 1,2,3,4 1 PDA Test Notes The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method of MIL-STD-883. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
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