|Description||6.9V Precision Reference|
|Company||Linear Technology Corporation|
|Datasheet||Download RH129B datasheet
The RH129 precision reference features excellent stability over a wide range of voltage, temperature and operating current conditions. The device achieves low dynamic impedance by incorporating a high gain shunt regulator around the Zener. The excellent noise performance of the device is achieved by using a buried Zener design which eliminates surface noise usually associated with ordinary Zeners. The wafer lots are processed to LTC's in-house Class S flow to yield circuits usable in stringent military applications.
Reverse Breakdown Current................................ 30mA Forward Current..................................................... 2mA Operating Temperature Range............. to 125°C Storage Temperature Range................. to 150°C Lead Temperature (Soldering, 10 sec).................. 300°CW U BUR -I CIRCUIT TOTAL DOSE BIAS CIRCUIT PACKAGE INFORMATION
SYMBOL PARAMETER IR VZ Temp Reverse Breakdown Voltage Reverse Breakdown Voltage Change with Current Temperature Coefficient CONDITIONS ± 0.3% NOTES MIN 6.7Change en VZ Time Dynamic Impedance RMS Noise Long Term Stability
Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
Reverse Breakdown Voltage R 15mA Reverse Breakdown Voltage R 15mA Change with Current Temperature Coefficient RH129B RH129CNote 1: Guaranteed by design, characterization or correlation to other tested parameters.
Note 2: Guaranteed by correlation testing including enhancements for popcorn noise detection. Note = 25°C unless otherwise noted.
MIL-STD-883 TEST REQUIREMENTS Final Electrical Test Requirements (Method 5004) Group A Test Requirements (Method 5005) Group B and D for Class S and Group C and D for Class B End Point Electrical Parameters (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. SUBGROUP PDA Test Notes: The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method of MIL-STD-883. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given.REVERSE BREAKDOWN VOLTAGE CHANGE WITH CURRENT (mV)
1630 McCarthy Blvd., Milpitas, (408) 432-1900 FAX: (408) 434-0507q TELEX: 499-3977 q www.linear-tech.comReverse Breakdown Voltage Change with Current
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