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Details, datasheet, quote on part number:DG508AAZ/883B
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Datasheet text preview:
SCOPE: MONOLITHIC CMOS, ANALOG MULTIPLEXER Device Type 01 Generic Number DG508AA(x)/883B SMD Number 7705201
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter MAXIM SMD K E L X P E Z 2 Mil-Std-1835 GDIP1-T16 or CDIP2-T16 CDFP4-16 GDIP1-T16 or CDIP2-T16 CQCC1-N20 Case Outline Package Code J16 F16 P16 L20
16 LEAD CERDIP 16 LEAD FLATPACK 16 LEAD Sidebraze 20-Pin Ceramic LCC
Absolute Maximum Ratings Voltage Referenced to VV+ to V- ............ 44V V+ to GND ...... +22V V- to GND ........ -22V Digital Inputs, VS or VD 1/........ (V-) -3.0V to (V+) Analog Inputs Voltage ......... (V-) -2.0V to (V+)+2V Analog Input, Overvoltage Range ...... (V-) -3.0V to (V+) Lead Temperature (soldering, 10 seconds) .......... +300°C Storage Temperature .... -65°C to +150°C Continuous Power Dissipation ........... TA=+70°C 16 lead FLATPACK (derate 6.1mW/°C above +70°C) ............ 485mW 16 lead CERDIP(derate 10.0mW/°C above +70°C) ........ 800mW 16 lead Side Braze(derate 10.5mW/°C above +70°C) ..... 842mW 20 lead LCC (derate 9.1mW/°C above +70°C) ......... 727mW Junction Temperature TJ ......... +150°C Thermal Resistance, Junction to Case, JC: Case Outline 16 lead FLATPACK ... 65°C/W Case Outline 16 lead CERDIP.......... 50°C/W Case Outline 16 lead Side Braze....... 45°C/W Case Outline 20 lead LCC ...... 20°C/W Thermal Resistance, Junction to Ambient, JA: Case Outline 16 lead FLATPACK .. 165°C/W Case Outline 16 lead CERDIP......... 100°C/W Case Outline 16 lead Side Braze........ 95°C/W Case Outline 20 lead LCC ..... 110°C/W Recommended Operating Conditions. Ambient Operating Range (TA) ...... -55°C to +125°C NOTE 1: Signals on S, D, IN exceeding V+ or V- will be clamped by internal diodes. Limit forward diode current to maximum current ratings. Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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Electrical Characteristics of DG508A/883B for SMD 7705201
19-0339 Page 2 of
Rev. B 6
TABLE 1. ELECTRICAL TESTS CONDITIONS -55 °C <=TA<= +125°C V+=+15V, V-=-15V, GND=0V VAH=2.4V, VAL=0.8V, VEN=4.5V Unless otherwise specified Measure inputs sequentially, connect all unused inputs to GND Measure inputs sequentially, connect all unused inputs to 5.0V ID =±1mA, VS=±10V V+=+10V, V-=±10V, ID =±1mA, VS=±7.5V VS =+/-10V, VEN=0.8V, All unused inputs=±10V VD=±10V, VEN=0.8V, All unused inputs=±10V VS =+/-10V, VD=-/+10V, All unused inputs=±10V VA=0V, VEN=0V VA=0V, VEN=0V
Group A Subgroup Device type
TEST SWITCH Input Leakage Current 2/ Input Leakage Current 2/ Switch ON Resistance Switch ON Resistance Source-OFF Leakage Current Drain-OFF Leakage Current Drain-ON Leakage Current INPUT Standby Positive Supply Current Standby Negative Supply Current SUPPLY Positive Supply Current Negative Supply Current DYNAMIC Capacitance: Address Capacitance: Output Switch Capacitance: Input Switch Charge Transfer Error Single Channel Isolation Crosstalk Between Channels Break Before Make Time Delay Propagation Delay: Address Inputs to I/O Channels Enable to I/O
Symbol
Limits Min
Limits Max
Units
IIH I IL
1,2,3
1,2,3
All All All All All All All
0.8 -0.8 400 500 1000 -50 -250 -250 50 250 250
µA µA nA nA nA
rDS(ON1) rDS(ON2)
±IS(OFF) ±ID(OFF) ±ID(ON)
1,3 2 1,2,3 1,2,3 1,2,3 1,2,3
+ISBY -ISBY
1 ,2,3 1 ,2,3
All All
3.5 -3.5
mA mA
I+ I+
VEN=5V, VA=0V VEN=5V, VA=0V V+=V-=0V, f=1MHz, NOTE 3 V+=V-=0V, f=1MHz, NOTE 3 V+=V-=0V, f=1MHz, NOTE 3 VS=GND, VGEN=0V to 5V, f=500kHz, CL=100pF NOTE 3 VGEN=1Vp-p, f=200kHz NOTE 3 VGEN=1Vp-p, f=200kHz NOTE 3 Figure 3 Figure 1,2, RL=1k, CL=100pF Figure1,2, RL=1k, CL=100pF
1 ,2,3 1 ,2,3
All All
12 -12
mA mA
CA COS C IS VCTE VISO VCT
4 4 4 4 4 4 9 9,11 10 9,11 10
All All All All All All All All
10 45 10 10 50 50 5.0 1000 1500 1000 1500
pF pF pF mV dB dB ns ns ns
tD tON(A) tOFF(A) tON(EN) tOFF(EN)
All
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Electrical Characteristics of DG508A/883B for SMD 7705201
19-0339 Page 3 of
Rev. B 6
NOTE 2: Input Current of one input mode. NOTE 3: Guaranteed, if not tested, to the limits specified. FIGURE 1: SWITCHING TIME TEST CIRCUIT: See Commercial Data Sheet FIGURE 2: ENABLE TIME TEST CIRCUIT: See Commercial Data Sheet FIGURE 3: BREAK-BEFORE-MAKE TEST CIRCUIT: See Commercial Data Sheet
ORDERING INFORMATION: DG508AAK/883B DG508AAL/883B DG508AAP/883B DG508AAZ/883B
SMD NUMBER 7705201EA 7705201XC 7705201EC 77052012C
PACKAGE CODE 16 CERDIP 16 FLATPACK 16 SIDE BRAZE 20 LCC
TRUTH TABLE A2 X L L L L H H H H A1 X L L H H L L H H A0 X L H L H L H L H EN L H H H H H H H H DG508A ON SWITCH None 1 2 3 4 5 6 7 8 TERMINAL NUMBER 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
TERMINAL CONNECTION DG508A J16, P16 & F16 A0 EN VI N1 I N2 I N3 I N4 OUT I N8 IN7 I N6 I N5 V+ GND A2 A1 DG508A L20 NC A0 EN VI N1 NC I N2 I N3 I N4 OUT NC I N8 I N7 IN6 I N5 NC V+ GND A2 A1
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Electrical Characteristics of DG508A/883B for SMD 7705201
19-0339 Page 4 of
Rev. B 6
QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in MilStd-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition, A, B, C, or D. 2. TA = +125°C minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table 1. b. Steady-state life test, Method 1005 of Mil-Std-883: 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Interim Electric Parameters Method 5004 Final Electrical Parameters Method 5005 Group A Test Requirements Method 5005 Group C and D End-Point Electrical Parameters Method 5005 * ** *** Subgroups per Method 5005, Table 1 1 1*, 2, 3, 4** 1, 2, 3, 4**, 9, 10, 11*** 1
PDA applies to Subgroup 1 only. Subgroup 4 (capacitance measurements) shall be measured only for the initial test and after process or design changes which may affect capacitance. Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in Table 1.
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Electrical Characteristics of DG508A/883B for SMD 7705201
19-0339 Page 5 of
Rev. B 6
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