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Details, datasheet, quote on part number:MX7824TQ/883B
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Datasheet text preview:
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CMOS HIGHSPEED 8-BIT A/D CONVERTER WITH TRACK AND HOLD Generic Number MX7824T(x)/883B MX7824U(x)/883B
Device Type 01 02
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Mil-Std-1835 MAXIM SMD Q L GDIP1-T24 or CDIP2-T24 Case Outline 24 LEAD CERDIP Package Code J24
Absolute Maximum Ratings Supply Voltage to GND .... 0V, +7V Digital Input Voltage .... -0.3V, VDD Digital Output Voltage .. -0.3V, VDD Positive Reference Voltage .... VREF- to VDD Negative Reference Voltage ............ 0V to VREF+ Input Voltage (VIN) .... -0.3V to VDD Lead Temperature (soldering, 10 seconds) ...... +300°C Storage Temperature .......... -65°C to +150°C Continuous Power Dissipation .......... TA=+70°C 24 pin CERDIP(derate 12.5mW/°C above +70°C) ...... 1000mW Junction Temperature TJ ....... +150°C Thermal Resistance, Junction to Case, JC 24 pin CERDIP.......... 40°C/W Thermal Resistance, Junction to Ambient, JA: 24 pin CERDIP......... 80°C/W Recommended Operating Conditions Ambient Operating Range (TA) .... -55°C to +125°C Supply Voltage Range (VDD) ......... +4.75V to 5.25V Positive Reference Voltage (VREF+) .... +5.0V Negative Reference Voltage (VREF-) ......... 0V Ground Potential (GND) .... 0V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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Electrical Characteristics of MX7824/883B for /883B and SMD 5962-8876401 & 02
19-1036 Page 2 of
Rev. C 9
TABLE 1. ELECTRICAL TESTS: CONDITIONS -55 °C TA +125°C 1/ 2/ Unless otherwise specified Guaranteed but not tested
Group A
Subgroup
TEST Resolution Total Unadjusted Error NOT E 3 Analog Input Voltage Range Analog Input Leakage Current Analog Input Capacitance Reference Input Resistance Digital Input High Level Voltage Digital Input Low Level Voltage Digital Input High Current Digital Input Low Current Digital Input Capacitance Digital Output High Level Voltage Digital Output Low Level Voltage Floating State Leakage Current Slew Rate, Tracking Capacitance NOTE 4 Digital Output Capacitance Supply Current Power Supply Sensitivity __ __ CS to RD Setup Time __ __ CS to RD Hold Time __ CS to RDY delay Conversion Time, Mode 0 Data Access Time __ After RD, Mode 1
Symbol RES T UE
Device type All 01 02 All All All All All All All All All All
Limits Min 8
Limits Max ±1.0
Units LSB LSB V µA pF k V V µA µA
1 ,2 ,3 1,2,3
VIN IIN CIN1 RIN VIH V IL IIH I IL CIN2 V OH V OL 0V, 5V, NOTE 4 NOT E 4 ___ __ A0, A1, RD, CS ___ __ A0, A1, RD, CS ___ __ A0, A1, RD, CS ___ __ A0, A1, RD, CS ___ __ NOTE 4 A0, A1, RD, CS ___ DB0-DB7, INT, ISOURCE=360µA ___ DB0-DB7, INT, ISINK=1.6mA RDY, ISINK=2.6mA, NOTE 5 DB0-DB7 only
1
VREF-3.0 1.0 2.4
±0.5 VREF+ +3.0 45 4 .0
1,2,3 4 1 ,2,3 1,2,3 1,2,3 1,2,3 1,2,3 4 1,2,3
0.8 1.0 -1.0 8.0 4.0 0.4
pF V
1,2,3 1,2,3 4
All All All All All All All All All All All
V 0.4 ±3.0 0.157 8.0 20.0 ±0.25 0 0 40 60 2.0 2.8 85 120 µA V/µs pF mA LSB ns ns ns µs ns
I OUT
COUT I DD PSS tCSS tCSH tRDY tCRD tACC1
NOT E 4 __ ___ CS=RD=2.4V V DD = 5 . 0 V ± 5 % Figure 3 Figure 3 Pull-up resistor=5k, CL=50pF, Figure 3 See Figure 3. NOTE 7 NOTE 6 and 7 Figure 3 and 5
4 1,2,3 1,2,3 9,10,11 9,10,11 9 10,11 9 10,11 9 10,11
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Electrical Characteristics of MX7824/883B for /883B and SMD 5962-8876401 & 02
19-1036 Page 3 of
Rev. C 9
TEST __ ___ RD to INT Delay, NOTE 5 Data Hold Time Delay Time Between Conversion Read Pulse Width, Mode 1 Data Access Time After ___ INT, Mode 0 Multiplexer Address Setup Time Multiplexer Address Hold Time
Symbol tINTH tDH tP tRD tACC2 tAS tAH
CONDITIONS -55 °C TA +125°C 1/ 2/ Unless otherwise specified CL=50pF NOTE 8, Figure 3,4 Figure 3 Figure 3 NOTE 6, 7, Figure 3,5 Figure 3 Figure 3
Group A
Subgroup
Device type All All All All All
Limits Min
Limits Max 75 100 60 70
Units ns ns ns
9 10,11 9 10,11 9 10,11 9 10,11 9 10,11 9,10,11 9 10,11
500 600 60 80
600 400 50 70
ns ns ns ns
All All
0 30 40
NOTE 1: VDD=+5V, VREF(+)=+5V; VREF(-)=GND=0V, unless otherwise specified. Specifications apply for mode 0. All input control signals are specified with tr=tf=20ns (10 percent to 90 percent of +5.0V) and timed from a voltage level of 1.6V. NOTE 2: Subgroups 10 and 11, if not tested, shall be guaranteed to the limits specified in Table 1. NOTE 3: Total unadjusted error includes offset, full-scale, and linearity errors. NOTE 4: The (CIN1, CIN2, RIN, COUT, and SR measurements) are measured initially and after any process or design changes which may affect these tests. NOTE 5: RDY is an open-drain output. NOTE 6: Measured with load circuits of Figure 5 and defined as the time required for an output to cross 0.8V or 2.4V. NOTE 7: If not tested, it shall be guaranteed to the limits specified in Table 1. NOTE 8: Defined as the time required for the data lines to change 0.5V when loaded with the circuits of Figure 4 and is measured only for the initial test and after process or design change which may affect tDH. TERMINAL CONNECTIONS J24 J24 1 AIN4 13 VREF2 AIN3 14 VREF+ 3 AIN2 15 RDY 4 AIN1 16 __ CS 5 NC 17 DB 4 6 DB 0 18 DB 5 7 DB 1 19 DB 6 8 DB 2 20 DB 7 9 DB 3 21 A1 10 __ 22 A0 RD 11 ___ 23 NC INT 12 GND 24 V DD
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Electrical Characteristics of MX7824/883B for /883B and SMD 5962-8876401 and 02
19-1036 Page 4 of
Rev. C 9
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