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Details, datasheet, quote on part number:25AA040T-I/ST
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| Part: | 25AA040T-I/ST |
| Category: | Memory => ROM => EEPROM => Serial => SPI->4K to 64K |
| Description: | The 25AA040 is a 4K Bit Serial Electrically Erasable Prom With Memory Accessed Via a Simple Serial Peripheral Interface (SPI™) Compatible Serial Bus |
| Company: | Microchip Technology, Inc. |
| Datasheet: | Download 25AA040T-I/ST datasheet File size : 343 kB |
| Request For quote: | Find where to buy 25AA040T-I/ST
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Datasheet text preview:
M
Part Number 25AA040 25LC040 25C040 VCC Range 1.8-5.5V 2.5-5.5V 4.5-5.5V
25AA040/25L C040/25C 040
DESCRIPTION
Temp. Ranges I I I,E The Microchip Technology Inc. 25AA040/25LC040/ 25C040 (25XX040*) is a 4 Kbit serial Electrically Erasable PROM. The memory is accessed via a simple Serial Peripheral InterfaceTM (SPITM) compatible serial bus. The bus signals required are a clock input (SCK) plus separate data in (SI) and data out (SO) lines. Access to the device is controlled through a chip select (CS) input. Communication to the device can be paused via the hold pin (HOLD). While the device is paused, transitions on its inputs will be ignored, with the exception of chip select, allowing the host to service higher priority interrupts. Also, write operations to the device can be disabled via the write protect pin (WP).
4K SPITM Bus Serial EEPROM
DEVICE SELECTION TABLE
Max. Clock Frequency 1 MHz 2 MHz 3 MHz
FEATURES
· Low power CMOS technology - Write current: 3 mA typical - Read current: 500 µA typical - Standby current: 500 nA typical · 512 x 8-bit organization · 16 byte page · Write cycle time: 5 ms max. · Self-timed ERASE and WRITE cycles · Block write protection - Protect none, 1/4, 1/2 or all of array · Built-in write protection - Power on/off data protection circuitry - Write enable latch - Write protect pin · Sequential read · High reliability - Endurance: 1M cycles - Data retention: > 200 years - ESD protection: > 4000V · 8-pin PDIP, SOIC, and TSSOP packages · Temperature ranges supported: - Industrial (I): -40°C to +85°C - Automotive (E) (25C040): -40°C to +125°C
BLOCK DIAGRAM
Status Regist er HV Generator
I/O Control Logic
M e mo r y Cont rol Logic
X Dec
EEPROM Array
Page Latches
SI SO CS SCK HOLD WP VCC VSS
Y Decoder
Sense Amp. R/W Control
PACKAGE TYPES
PDIP
CS SO WP VSS 1 8 VC C HOLD SCK SI CS SO WP VSS 1
SOIC
8 VC C HOLD SCK SI HOLD VCC CS SO 1
TSSOP
8 SCK SI VSS WP
25XX040
25XX040
25XX040
2 3 4
7 6 5
2 3 4
7 6 5
2 3 4
7 6 5
*25XX040 is used in this document as a generic part number for the 25AA040/25LC040/25C040 devices. SPITM is a trademark of Motorola Inc.
2001 Microchip Technology Inc.
DS21204C- page 1
25AA040/25LC040/25C040
1.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
VCC ........... 7.0V All inputs and outputs w.r.t. VSS .......... -0.6V to VCC+1.0V Storage temperature ...... -65°C to 150°C Ambient temperature under bias ...... -65°C to 125°C Soldering temperature of leads (10 seconds) ............. +300°C ESD protection on all pins ........ 4 KV NOTICE: Stresses above those listed under `Maximum ratings' may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an extended period of time may affect device reliability
1.1
DC Characteristics
DC CHARACTERISTICS Industrial (I): TAMB = -40°C to +85°C Automotive (E): TAMB = -40°C to +125°C Mi n . 2. 0 0.7 VCC -0. 3 -0. 3 -- -- VCC -0.5 - 10 - 10 -- -- -- -- -- Standby Current -- -- Ma x . VCC+1 VCC+1 0. 8 0.3 VCC 0. 4 0. 2 -- 10 10 7 1 500 5 3 5 1 Units V V V V V V V
µA µA
VCC = 1.8V to 5.5V VCC = 4.5V to 5.5V (25C040 only) Test Conditions
Param. No. D001 D002 D003 D004 D005 D006 D007 D008 D009 D010 D011 D012 D013 Note:
S ym. VIH1 VIH2 VIL1 VIL2 VOL VOL VOH ILI ILO CINT ICC Read ICC Write ICCS
Characteristic High level input voltage Low level input voltage Low level output voltage High level output voltage Input leakage current Output leakage curr ent Internal Capacitance (all inputs and outputs) Operating Current
VCC 2.7V (Note) VCC< 2.7V (Note) VCC 2.7V (Note) VCC < 2.7V (Note) IOL = 2.1 mA IOL = 1.0 mA, VCC < 2.5V IOH =-400 µA CS = VCC, VIN = VSS TO VCC CS = VCC, VOUT = VSS TO VCC TAMB = 25°C, CLK = 1.0 MHz, VCC = 5.0V (Note) VCC = 5.5V; FCLK = 3.0 MHz; SO = Open VCC = 2.5V; FCLK = 2.0 MHz; SO = Open VCC = 5.5V VCC = 2.5V CS = VCC = 5.5V, Inputs tied to VCC or VSS CS = VCC = 2.5V, Inputs tied to VCC or VSS
pF mA µA mA mA
µA µA
This parameter is periodically sampled and not 100% tested.
DS2120 4C-page 2
2001 Microchip Technology Inc.
25AA040/25LC040/25C040
1.2 AC Characteristics
AC CHARACTERISTICS Param. No. 1 S ym. FCLK Characteristic Clock Frequency Industrial (I): TAMB = -40°C to +85°C Automotive (E): TAMB = -40°C to +125°C Min. -- -- -- 100 250 500 150 250 475 500 30 50 50 50 100 100 -- -- 150 230 475 150 230 475 50 50 -- -- -- 0 -- -- -- 100 100 200 100 100 200 100 150 200 100 150 200 -- 1M M ax. 3 2 1 -- -- -- -- -- -- -- -- -- -- -- -- -- 2 2 -- -- -- -- -- -- -- -- 150 230 475 -- 200 250 500 -- -- -- -- -- -- -- -- -- -- -- -- 5 -- Units MHz MHz MHz ns ns ns ns ns ns ns ns ns ns ns ns ns
µs µs
VCC = 1.8V to 5.5V VCC = 4.5V to 5.5V (25C040 only) Test Conditions
VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V -- VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V ( N o te 1 ) ( N o te 1 ) VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V -- -- VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V ( N o te 1 ) VCC = 4.5V to 5.5V (Note 1) VCC = 2.5V to 4.5V (Note 1) VCC = 1.8V to 2.5V (Note 1) VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V VCC = 4.5V to 5.5V (Note 1) VCC = 2.5V to 4.5V (Note 1) VCC = 1.8V to 2.5V (Note 1) VCC = 4.5V to 5.5V VCC = 2.5V to 4.5V VCC = 1.8V to 2.5V
--
2
TCSS
CS Setup Time
3
TCSH
CS Hold Time
4 5
TCSD TSU
CS Disable Time Data Setup Time
6
THD
Data Hold Time
7 8 9
TR TF THI
CLK Rise Time CLK Fall Time Clock High Time
ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms E/W Cycles
10
TLO
Clock Low Time
11 12 13
TCLD TCLE TV
Clock Delay Time Clock Enable Time Output Valid from Clock Low
14 15
THO TDIS
Output Hold Time Output Disable Time
16
THS
HOLD Setup Time
17
THH
HOLD Hold Time
18
THZ
HOLD Low to Output High-Z
19
THV
HOLD High to Output Valid
20 21
TWC
--
Internal Write Cycle Time Endur ance
( N o te 2 )
Note 1: This parameter is periodically sampled and not 100% tested. 2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific application, please consult the Total Endurance Model which can be obtained on our website: www.microchip.com.
2001 Microchip Technology Inc.
DS21204C- page 3
25AA040/25LC040/25C040
FIGURE 1-1:
CS 16 SCK 18 SO n+2 n +1 n high impedance 19 n 5 n n-1 n-1 17 16 17
HOLD TIMING
don't care SI HOLD n+2 n+1 n
FIGURE 1-2:
SERIAL INPUT TIMING
4
CS 2 Mode 1,1 SCK Mode 0,0 5 SI 6 LSB in 7 8 3
12 11
MSB in
SO
high impedance
FIGURE 1-3:
SERIAL OUTPUT TIMING
CS 9 SCK 13 14 SO MSB out 15 ISB out 10 3 Mode 1,1 Mode 0,0
SI
don't care
DS2120 4C-page 4
2001 Microchip Technology Inc.
25AA040/25LC040/25C040
1.3 AC Test Conditions
VLO = 0.2V VH I = VCC - 0.2V VH I = 4.0V Input Output Note 1: For VCC 4.0V 2: For VCC > 4.0V -- (Note 1) (Note 2) SO 0.5 VCC 0.5 VCC 1.8 K 100 pF 2.25 K
FIGURE 1-4:
AC TEST CIRCUIT AC
VCC
AC Waveform:
Timing Measurement Reference Level
2001 Microchip Technology Inc.
DS21204C- page 5
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