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Details, datasheet, quote on part number:100371MD8
 
 
Part:100371MD8
Category:Logic => Military/Aerospace->ECL
Description:100371 - Low Power Triple 4-Input Multiplexer With Enable, Package: Cerquad, Pin Nb=24
Company:National Semiconductor Corporation
Datasheet:Download 100371MD8 datasheet   File size : 126 kB
Request For quote:  Find where to buy 100371MD8
 



Datasheet text preview:
100371 Low Power Triple 4-Input Multiplexer with Enable

September 1998

100371 Low Power Triple 4-Input Multiplexer with Enable
General Description
The 100371 contains three 4-input multiplexers which share a common decoder (inputs S0 and S1). Output buffer gates provide true and complement outputs. A HIGH on the Enable input (E) forces all true outputs LOW (see Truth Table). All inputs have 50 k pull-down resistors. n n n n 2000V ESD protection Pin/function compatible with 100171 Voltage compensated operating range = -4.2V to -5.7V Available to MIL-STD-883

Features
n 35% power reduction of the 100171

Logic Symbol

Pin Names I0x­ I3x S0, S1 E Za­ Zc Za­ Zc Data Inputs

Description Select Inputs Enable Input (Active LOW) Data Outputs Complementary Data Outputs

DS100975-1

© 1998 National Semiconductor Corporation

DS100975

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Connection Diagrams
24-Pin DIP

DS100975-2

24-Pin Quad Cerpak

DS100975-3

Logic Diagram

DS100975-5

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Truth Table
Inputs E L L L L H S0 L H L H X S1 L L H H X Outputs Zn I0x I1x I2x I3x L

H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care

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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic VEE Pin Potential to Ground Pin Input Voltage (DC) Output current (DC Output HIGH) ESD (Note 2) -65°C to +150°C +175°C -7.0V to +0.5V VEE to +0.5V -50 mA 2000V

Recommended Operating Conditions
Case Temperature (TC) Military Supply Voltage (VEE) -55°C to +125°C -5.7V to -4.2V

Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

Military Version DC Electrical Characteristics
VEE = -4.2V to -5.7V, VCC = VCCA = GND, TC = -55°C to +125°C Symbol VOH Parameter Output HIGH Voltage Min -1025 -1085 VOL Output LOW Voltage -1830 -1830 VOHC Output HIGH Voltage -1035 -1085 VOLC Output LOW Voltage -1610 -1555 VIH VIL IIL IIH Input HIGH Voltage Input LOW Voltage Input LOW Current Input HIGH Current I0X­ I3X S0, S1, E I0X­ I3X S0, S1, E IEE Power Supply Current -80 340 300 490 450 -30 mA -55°C to +125°C Inputs Open (Notes 3, 4, 5) µA µA 0°C to +125°C -55°C VEE = -5.7V VIN = VIH (Max) (Notes 3, 4, 5) -1165 -1830 0.50 -870 -1475 Max -870 -870 -1620 -1555 Units mV mV mV mV mV mV mV mV mV mV µA TC 0°C to +125°C -55°C 0°C to +125°C -55°C 0°C to +125°C -55°C 0°C to +125°C -55°C -55°C to +125°C -55°C to +125°C -55°C to +125°C Guaranteed HIGH Signal for All Inputs Guaranteed LOW Signal for All Inputs VEE = -4.2V VIN = VIL (Min) (Notes 3, 4, 5, 6) (Notes 3, 4, 5, 6) (Notes 3, 4, 5) VIN = VIH (Min) or VIL (Max) Loading with 50 to -2.0V (Notes 3, 4, 5) VIN = V (Max) or VIL (Min) Loading with 50 to -2.0V (Notes 3, 4, 5) Conditions Notes

Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55°C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissapation after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at -55°C, +25°C, and +125°C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at -55°C, +25°C, and +125°C, Subgroups 1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.

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Military Version AC Electrical Characteristics
VEE = -4.2V to -5.7V, VCC = VCCA = GND Symbol tPLH tPHL tPLH tPHL tPLH tPHL tTLH tTHL Parameter Propagation Delay I0x­ I3x to Output Propagation Delay S0, S1to Output Propagation Delay E to Output Transition Time 20% to 80%, 80% to 20% 0.20 1.60 0.30 1.50 0.20 1.60 ns (Note 10) 0.50 2.70 0.60 2.40 0.50 2.90 ns 0.40 2.70 0.60 2.40 0.50 2.90 ns TC = -55°C Min 0.10 Max 1.90 TC = +25°C Min 0.20 Max 1.70 TC = +125°C Min 0.20 Max 2.00 ns (Notes 7, 8, 9, 11) Units Conditions Notes

Figures 1, 2

Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55°C), then testing immediately after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25°C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25°C, Subgroup A9, and at +125°C and -55°C temperatures, Subgroups A10 and A11. Note 10: Not tested at +25°C, +125°C and -55°C temperature (design characterization data). Note 11: The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.

Test Circuitry

DS100975-6

Notes: VCC, VCCA = +2V, VEE = -2.5V L1 and L2 = equal length 50 impedance lines RT = 50 terminator internal to scope Decoupling 0.1 µF from GND to VCC and VEE All unused outputs are loaded with 50 to GND CL = Fixture and stray capacitance 3 pF Pin numbers shown are for flatpak; for DIP see logic symbol

FIGURE 1. AC Test Circuit

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