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Details, datasheet, quote on part number:NB100EP223FA
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Datasheet text preview:
AND8090/D AC Characteristics of ECL Devices
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APPLICATION NOTE
APPLICATION NOTE USAGE This application note provides a general overview of the AC characteristics that are specified on the ON Semiconductor data sheets for MECL 10KTM, 10HTM, 100H, ECLinPSTM, ECLinPS LiteTM, and GigaCommTM SiGe devices. Data sheet information takes precedence over this application note if there are differences. This application note includes the following information: · AC Test Bench Information · AC Characteristic Definitions · AC Characteristic Test Methods · AC Characteristic Examples · AC Characteristic Symbols · AC Characteristic References TABLE OF CONTENTS
Lab Testing Test Bench Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Test Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Test Bench Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . 3 AC Test Boards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Signal Levels AC HIGH and LOW Levels . . . . . . . . . . . . . . . . . . . . . . 5 Oscilloscope Averaging . . . . . . . . . . . . . . . . . . . . . . . . . 5 Input Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Output Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Output Swing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Signal Timing Duty Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Maximum Input Frequency . . . . . . . . . . . . . . . . . . . . . . 6 Differential Characteristics Differential Input Application . . . . . . . . . . . . . . . . . . . . . 7 Unused Output Termination . . . . . . . . . . . . . . . . . . . . . . 7 Differential Crosspoint . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Input Voltage Swing . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Test Input Swing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
© Semiconductor Components Industries, LLC, 2003
Differential Characteristics (continued) Common Mode Range . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Differential Input Example . . . . . . . . . . . . . . . . . . . . . . . 8 Single-Ended Characteristics Single-Ended Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Single-Ended 50% Points . . . . . . . . . . . . . . . . . . . . . . . 8 SingleEnded Input Voltage Range . . . . . . . . . . . . . . . 8 SingleEnded Input Test Level . . . . . . . . . . . . . . . . . . . 8 Differential Inputs (SingleEnded Mode) . . . . . . . . . . . 9 Timing Characteristics Output Rise and Fall Times . . . . . . . . . . . . . . . . . . . . . . 9 Propagation Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Skew (Duty Cycle) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Skew (Within Device) . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Skew (Device to Device) . . . . . . . . . . . . . . . . . . . . . . . 11 Minimum Input Pulse Width . . . . . . . . . . . . . . . . . . . . . 11 Setup and Hold Time . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Set and Reset Recovery Time . . . . . . . . . . . . . . . . . . 14 Jitter Jitter Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Random Jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 RJ Confidence Levels . . . . . . . . . . . . . . . . . . . . . . . . . 15 Total RJ Test Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Test Equipment RJ Test Setup . . . . . . . . . . . . . . . . . . 16 DUT RJ Calculation . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Deterministic Jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Total DJ Test Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Test Equipment DJ Test Setup . . . . . . . . . . . . . . . . . . 18 DUT DJ Calculation . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Symbols and Acronyms Symbols and Acronyms Table . . . . . . . . . . . . . . . . . . . 19 References AC Characteristic References . . . . . . . . . . . . . . . . . . . 20
1 Publication Order Number: AND8090/D
November, 2003 - Rev. 1
AND8090/D
LAB TESTING
Test Bench Overview
· The test cables are connected from the DUT test board
output connectors to the appropriate digital sampling oscilloscope input connectors. · The power supply cables are connected to the DUT test board power supply connectors. · The airflow regulator is set to 500 lfpm and the desired DUT ambient air temperature. The DUT is in this environment for a minimum of 3 minutes before testing begins. Data sheet specifications are typically given for -40°C, 25°C, and 85°C.
Specialized test benches are used to determine the AC characteristics of the Device-Under-Test (DUT). A typical test bench setup for a differential device is shown in Figure 1.
Test Initialization
· The test cables are connected from the pulse generator to
the appropriate DUT test board input connectors.
TRIGGER 50 W COAX 50 W COAX VCC TRIGGER OSCILLOSCOPE 50 W COAX 50 W COAX CHANNEL C (50 W) CHANNEL A (50 W) CHANNEL B (50 W)
Q PULSE GENERATOR Q
D
Q
50 W COAX
D
Q
50 W COAX
CHANNEL D (50 W)
Test Board VEE
Figure 1. AC Characterization Test Bench Setup
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2
AND8090/D
Test Bench Equipment
AC characterization equipment is carefully selected to ensure that the test equipment is suitable for the devices to be tested, and that the measurements are accurate and repeatable. For example, sampling head bandwidth
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