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Details, datasheet, quote on part number: NBXSBA024LNHTAG
 
 
Part numberNBXSBA024LNHTAG
CategoryTiming Circuits => Clock Generators
Description2.5V / 3.3 V, 622.08 MHz PureEdge™ Single Frequency LVPECL Clock Oscillator Module
The NBXSBA024, single frequency, crystal oscillator (XO) is designed to meet today\'s requirements for 2.5 V / 3.3 V LVPECL clock generation applications. The device uses a high Q fundamental mode crystal and Phase Lock Loop (PLL) multiplier to provide 622.08 MHz, ultra low jitter and phase noise LVPECL differential output. This device is a member of ON Semiconductor\'s PureEdge™ clock family that provides accurate and precision clock solutions. Frequency stability options available as either ±50 PPM NBXSBA024/NBXMBA024 (Industrial Temperature Range) or ±20 PPM NBXSBB024 (Commercial Temperature Range). Available in 5 mm x 7 mm SMD (CLCC) package on 16 mm tape and reel in quantities of 1,000 and 100.
Features
CompanyON Semiconductor
DatasheetDownload NBXSBA024LNHTAG datasheet
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Specifications, Features, Applications

The single frequency, crystal oscillator (XO) is designed to meet today's requirements for 3.3 V LVPECL clock generation applications. The device uses a high Q fundamental crystal and Phase Lock Loop (PLL) multiplier to provide 622.08 MHz, ultra low jitter and phase noise LVPECL differential output. This device is a member of ON Semiconductor's PureEdget clock family that provides accurate and precision clock solutions. Frequency stability options available as either ± 50 PPM NBXSBA024/NBXMBA024 (Industrial Temperature Range) or ±20 PPM NBXSBB024 (Commercial Temperature Range). Available 7 mm SMD (CLCC) package 16 mm tape and reel in quantities of 1,000 and 100.

LVPECL Differential Output Uses High Q Fundamental Mode Crystal and PLL Multiplier Ultra Low Jitter and Phase Noise ps (12 kHz - 20 MHz) Output Frequency - 622.08 MHz Hermetically Sealed Ceramic SMD Package RoHS Compliant Operating Range: V ±10% Total Frequency Stability - ±20 PPM; ±50 PPM This is a Pb-Free Device

NBXSBx024 = Specific Device Code NBXSBA024 (±50 PPM) NBXSBB024 (±20 PPM) 622.0800 = Output Frequency (MHz) AA = Assembly Location WL = Wafer Lot YY = Year WW = Work Week G = Pb-Free Package

Device NBXSBB024LN1TAG* NBXSBA024LNHTAG Package CLCC-6 (Pb-Free) CLCC-6 (Pb-Free) CLCC-6 (Pb-Free) CLCC-6 (Pb-Free) CLCC-6 (Pb-Free) Shipping 1000/ Tape & Reel 1000/ Tape & Reel 100/ Tape & Reel 1000/ Tape & Reel 100/ Tape & Reel

Applications
· SONET Line Card· Networking· Optical Systems

For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. * Please contact sales office for availability

Figure 2. Pin Connections (Top View) Table 1. PIN DESCRIPTION

I/O Description LVTTL/LVCMOS Control Input N/A Output Enable Pin. When left floating pin defaults to logic HIGH and output is active. See OE pin description Table 2. No Connect. Ground 0 V Power Supply LVPECL Output LVPECL Output Power Supply Non-Inverted Clock Output. Typically loaded with 50 W receiver termination resistor to VTT = VDD 2 V. Inverted Clock Output. Typically loaded with 50 W receiver termination resistor to VTT = VDD 2 V. Positive power supply voltage. Voltage should not exceed ±10%. *NBXMBA024 device pinout

OE Pin Open HIGH Level LOW Level Output Pins Active High Z

Characteristic Internal Default State Resistor ESD Protection Human Body Model Machine Model Value 200 V

Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test 1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.

Symbol VDD Iout TA Tstg Tsol Parameter Positive Power Supply LVPECL Output Current Operating Temperature Range Storage Temperature Range Wave Solder See Figure 5 Condition 1 GND 0 V Continuous Surge Condition 2 Rating +120 260 Units mA °C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.

Symbol IDD VIH VIL IIH IIL VOH VOL VOUTPP Characteristic Power Supply Current OE Input HIGH Voltage OE Input LOW Voltage Input HIGH Current Input LOW Current Output HIGH Voltage Output LOW Voltage Output Voltage Amplitude OE 2000 GND VDD-1945 700 Conditions Min. Typ. 95 Max. 105 VDD VDD-945 VDD-1600 Units mA mV

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 2. Measurement taken with outputs terminated with W to VDD 2.0 V. See Figure 4.

Symbol fCLKOUT Df Characteristic Output Clock Frequency Stability NBXSBA024, NBXMBA024 Phase-Noise Performance fCLKout = 622.08 MHz (See Figure to +85°C (Note Hz of Carrier 1 kHz of Carrier 10 kHz of Carrier 100 kHz of Carrier 1 MHz of Carrier 10 MHz of Carrier tjit(F) tjitter RMS Phase Jitter Cycle to Cycle, RMS Cycle to Cycle, Peak-to-Peak Period, RMS Period, Peak-to-Peak tOE/OD tDUTY_CYCLE tR tF tstart Output Enable/Disable Time Output Clock Duty Cycle (Measured at Cross Point) Output Rise Time (20% and 80%) Output Fall Time (80% and 20%) Start-up Time Aging 1st Year 1st kHz to 20 MHz 1000 Cycles 1000 Cycles 10,000 Cycles 10,000 Cycles Conditions Min. Typ. ±20 ±50 Max. Units MHz ppm

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 3. Measurement taken with outputs terminated with W to VDD 2.0 V. See Figure 4. Parameter guarantee 10 years aging. Includes initial stability at 25°C, shock, vibration, and first year aging.




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NBXMBA024LN1TAG   NBXMBA024LNHTAG   NBXSBA024LN1TAG  


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