|
Details, datasheet, quote on part number:74F244
| |
| Part: | 74F244 |
| Category: | Logic => Buffers/Drivers |
| Description: | 74F244/74F244B; Octal Buffers (3-State);; Package: SOT146-1 (DIP20), SOT163 (SO20), SOT339-1 (SSOP20) |
| Company: | Philips Semiconductors |
| Datasheet: | Download 74F244 datasheet File size : 107 kB |
| Request For quote: | Find where to buy 74F244
|
| |
Datasheet text preview:
INTEGRATED CIRCUITS
74F244/74F244B Octal buffers (3-State)
Product specification IC15 Data Handbook 1994 Dec 05
Philips Semiconductors
Philips Semiconductors
Product specification
Octal buffers (3-State)
74F244/74F244B
FEATURES
· Octal bus interface · 3-State output buffer sink 64mA · 15mA source current · Guaranteed output skew less than 2.0ns (74F244B) · Reduced ground bounce (74F244B) · Reduced ICC (74F244B) · Reduced loading (74F244B IIL = 40µA) · Split lead frame offers increased noise immunity (74F244B) · Industrial temperature range available (-40°C to +85°C) for
74F244
DESCRIPTION
The 74F244 is an octal buffer that is ideal for driving bus lines of buffer memory address registers. The outputs are all capable of sinking 64mA and sourcing up to 15mA, producing very good capacitive drive characteristics. The device features two output enables, OEa and OEb, each controlling four of the 3-State outputs. The 74F244B is functionally equivalent to the 74F244. It has been designed to reduce effects of ground noise. Other advantages are noted in the features. TYPICAL PROPAGATION DELAY 4.0ns 4.0ns
TYPE 74F244 74F244B
TYPICAL SUPPLY CURRENT (TOTAL) 53mA 33mA
· 74F244 available in SSOP Type II package
ORDERING INFORMATION
ORDER CODE COMMERCIAL RANGE DESCRIPTION VCC = 5V ±10%, Tamb = 0°C to +70°C 20-pin plastic DIP 20-pin plastic SOL 20-pin plastic SSOP II N74F244N, N74F244BN N74F244D, N74F244BD N74F244DB
INDUSTRIAL RANGE VCC = 5V ±10%, Tamb = -40°C to +85°C I74F244N I74F244D
PKG DWG # DWG
SOT146-1 SOT163-1 SOT339-1
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS Ian, Ibn Data inputs (74F244) Data inputs (74F244B) OEa, OEb Output enable inputs (active low) (74F244) Output enable inputs (active low) (74F244B) Yan, Ybn Data outputs NOTE: One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state. DESCRIPTION 74F (U.L.) HIGH/LOW 1.0/2.67 1.0/0.067 1.0/1.67 1.0/0.067 750/106.7 LOAD VALUE HIGH/LOW 20µA/1.6mA 20µA/40µA 20µA/1.0mA 20µA/40µA 15mA/64mA
PIN CONFIGURATION
OEa 1 Ia0 2 Yb0 3 Ia1 4 Yb1 5 Ia2 6 Yb2 7 Ia3 8 Yb3 9 GND 10 20 VCC 19 OEb 18 Ya0 17 Ib0 16 Ya1 15 Ib1 14 Ya2 13 Ib2 12 Ya3 11 Ib3
LOGIC SYMBOL
2 4 6 8 17 15 13 11
Ia0 1 19 OEa OEb
Ia1
Ia2
Ia3 Ib0
Ib1
Ib2
Ib3
Ya0 Ya1 Ya2 Ya3 Yb0 Yb1 Yb2 Yb3
18 VCC = Pin 20 GND = Pin 10
16
14
12
3
5
7
9
SF00227
SF00228
1994 Dec 5
2
853-0357 14381
Philips Semiconductors
Product specification
Octal buffers (3-State)
74F244/74F244B
IEC/IEEE SYMBOL
1 19 EN1 EN2
FUNCTION TABLE
INPUTS OEa L Ia L H X OEb L L H Ib L H X OUTPUTS Ya L H Z Yb L H Z
2 4 6 8 17 15 13 11
2D
1
18 16 14 12
L H
2
3 5 7 9
NOTES: H = High voltage level L = Low voltage level X = Don't care Z = High impedance "off" state
SF00229
LOGIC DIAGRAM
Ia0 2 18 Ya0 Ib0 17 3 Yb0
Ia1
4
16
Ya1
Ib1
15
5
Yb1
Ia2
6
14
Ya2
Ib2
13
7
Yb2
Ia3
8
12
Ya3
Ib3
11
9
Yb3
OEa
1
OEb
19
VCC = Pin 20 GND = Pin 10
SF00230
1994 Dec 5
3
Philips Semiconductors
Product specification
Octal buffers (3-State)
74F244/74F244B
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Supply voltage Input voltage Input current Voltage applied to output in high output state Current applied to output in low output state Commercial range Tamb Tstg Operating f free air t i temperature range t Storage temperature range Industrial range (74F244 only) PARAMETER RATING -0.5 to +7.0 -0.5 to +7.0 -30 to +5 -0.5 to VCC 128 0 to +70 -40 to +85 -65 to +150 UNIT V V mA V mA
°C °C °C
RECOMMENDED OPERATING CONDITIONS
LIMITS SYMBOL VCC VIN VIL IIK IOH iol Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Commercial range Operating f free air t i temperature range t Industrial range (74F244 only) 0 40 PARAMETER MIN 4.5 2.0 0.8 18 15 64 +70 +85 NOM 5.0 MAX 5.5 UNIT V V V mA mA mA
°C °C
1994 Dec 5
4
Philips Semiconductors
Product specification
Octal buffers (3-State)
74F244/74F244B
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER VCC = MIN, VOH High-level output voltage VIL = MAX, VIH = MIN IOH = -15mA TEST CONDITIONS1 IOH = -3mA ±10%VCC ±5%VCC ±10%VCC ±5%VCC VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN, VIK II IIH IIL Input clamp voltage Input current at maximum input voltage High-level input current 74F244 OEa, OEb Low-level input current 74F244 Ian, Ibn 74F244B all inputs IOZH IOZL IOS Off-state output current, high-level voltage applied Off-state output current, low-level voltage applied Short-circuit output current3 ICCH 74F244 ICC Supply current (total) ICCL ICCZ ICCH 74F244B ICCL ICCZ VCC = MAX VCC = MAX VCC = MAX, VO = 2.7V VCC = MAX, VO = 0.5V VCC = MAX -100 40 60 60 20 50 29 VCC = MAX, VI = 0.5V VCC = MIN, II = IIK VCC = MAX, VI = 7.0V VCC = MAX, VI = 2.7V IOL = MAX ±10%VCC ±5%VCC 0.42 -0.73 LIMITS MIN 2.5 2.7 2.0 2.0 0.55 0.55 -1.2 100 20 -1.0 -1.6 -40 50 -50 -225 60 90 90 30 70 40 3.4 TYP2 MAX UNIT V V V V V V V µA µA mA mA µA µA µA mA mA mA mA mA mA
mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last.
1994 Dec 5
5
|
|
