Details, datasheet, quote on part number: 74F51
CategoryLogic => Gates => AND-OR Gates
Description74F51; Dual 2-wide 2-input, 2-wise 3-input And-or-invert Gate;; Package: SOT108-1 (SO14), SOT27-1 (DIP14)
CompanyPhilips Semiconductors (Acquired by NXP)
DatasheetDownload 74F51 datasheet
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Features, Applications

DESCRIPTION 14-pin plastic DIP 14-pin plastic SO COMMERCIAL RANGE VCC 5V ±10%, Tamb N74F51N N74F51D PKG DWG SOT27-1 SOT108-1

PINS DESCRIPTION 74F (U.L.) HIGH/LOW Dna, Dnb, Dnc, Dnd, Dne, Dnf Data inputs Q0, Q1 Data outputs 50/33 NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state. LOAD VALUE HIGH/LOW 20µA/0.6mA 1.0mA/20mA

NOTES: H = High voltage level L = Low voltage level X = Don't care
All other combinations NOTES: H = High voltage level L = Low voltage level X = Don't care

(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Tamb Tstg Supply voltage Input voltage Input current Voltage applied to output in High output state Current applied to output in Low output state Operating free-air temperature range Storage temperature range PARAMETER RATING ­0.5 to VCC to +150 UNIT mA °C

LIMITS SYMBOL VCC VIH VIL IIK IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free-air temperature range 0 PARAMETER MIN NOM 5.0 MAX mA °C UNIT

(Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 VCC = MIN, VIL = MAX VIH = MIN, IOH = MAX Low level output voltage Low-level Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Short-circuit output current3 Supply current (total) ICCH VCC = MIN, VIL = MAX VIH = MIN, IOL = MAX VCC = MIN, II = IIK VCC = MAX, = 7.0V VCC = MAX, = 2.7V VCC = MAX, = 0.5V VCC = MAX VCC = MAX VIN = GND ±10%VCC ±5%VCC LIMITS MIN TYP2 MAX UNIT µA mA

ICCL VIN 7.5 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last.


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