Details, datasheet, quote on part number: 74F539
Part74F539
CategoryLogic => Decoder/Demultiplexers => Bipolar->F Family
TitleBipolar->F Family
DescriptionDual 1-of-4 Decoder (3-state)
CompanyPhilips Semiconductors (Acquired by NXP)
DatasheetDownload 74F539 datasheet
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Features, Applications

DESCRIPTION

The 74F539 contains two independent decoders. Each accepts two address - A1) input signals and decodes them to select one of four mutually exclusive outputs. A Polarity control (P) input determines whether the outputs are active Low (P=H) or active High (P=L). An active-Low Enable (E) is available for data demultiplexing. Data is routed to the selected output in non-inverted or inverted form in the active-Low mode or inverted form in the active-High mode. A High signal on the Output Enable (OEn) input forces the 3-State outputs to the high impedance state. TYPICAL SUPPLY CURRENT (TOTAL) 40mA

DESCRIPTION 20-Pin Plastic DIP 20-Pin Plastic SOL COMMERCIAL RANGE VCC 5V 10%, Tamb N74F539N N74F539D

PINS - A1b Ea, Eb OEa, OEb Pa, Q0aQ3a Q0bQ3b Decoder A Address inputs Decoder B Address inputs Enable inputs (active Low) Output Enable inputs (active Low) Polarity control inputs Decoder A Data outputs Decoder A Data outputs DESCRIPTION 74F(U.L.) HIGH/LOW LOAD VALUE HIGH/LOW 20A/0.6mA 3.0mA/24mA

NOTE: One (1.0) FAST Unit Load is defined as: 20A in the High state and 0.6mA in the Low state.

INPUTS OEn Q0n Z OUTPUTS Q1n Z Qn=P Q3n Z OPERATING MODE High Impedance Disable Active High output = L)

High voltage level Low voltage level Don't care High impedance "off" state

(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Tamb Tstg Supply voltage Input voltage Input current Voltage applied to output in High output state Current applied to output in Low output state Operating free-air temperature range Storage temperature PARAMETER RATING 0.5 to +VCC to +150 UNIT mA C

SYMBOL VCC VIH VIL IIK IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free-air temperature range 0 PARAMETER LIMITS MIN NOM 5.0 MAX 5.5 UNIT mA C

(Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL VOH O VOL VIK II IIH IIL IOZH IOZL IOS PARAMETER High level output voltage High-level TEST CONDITIONS1 VCC = MIN, VIL = MAX, VIH = MIN, IOH = MAX VCC = MIN, VIL = MAX, VIH = MIN, IOL = MAX VCC = MIN, II = IIK VCC = MAX, = 7.0V VCC = MAX, = 2.7V VCC = MAX, = 0.5V VCC = MAX, = 2.7V VCC = MAX, = 0.5V VCC = MAX ICCH ICC Supply current ICCL VCC = MAX 10%VCC 5%VCC LIMITS MIN TYP2 MAX UNIT A mA

Low-level output voltage Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Off-state output current High-level voltage applied Off-state output current Low-level voltage applied Short-circuit output current3

ICCZ 60 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb 25C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed last.


 

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