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Details, datasheet, quote on part number:74F85
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| Part: | 74F85 |
| Category: | Logic => Comparators |
| Description: | 74F85; 4-bit Magnitude Comparator;; Package: SOT162-1 (SO16), SOT38-1 (DIP16) |
| Company: | Philips Semiconductors |
| Datasheet: | Download 74F85 datasheet File size : 99 kB |
| Request For quote: | Find where to buy 74F85
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Datasheet text preview:
INTEGRATED CIRCUITS
74F85 4-bit magnitude comparator
Product specification IC15 Data Handbook 1994 Sep 27
Philips Semiconductors
Philips Semiconductors
Product specification
4-bit magnitude comparator
74F85
FEATURES
· High-impedance NPN base inputs for reduced loading
(20µA in High and Low states)
PIN CONFIGURATION
B3 IAB 1 2 3 4 5 6 7 8 16 15 14 13 12 11 10 9 VCC A3 B2 A2 A1 B1 A0 B0
· Magnitude comparison of any binary words · Serial or parallel expansion without extra gating
DESCRIPTION
The 74F85 is a 4-bit magnitude comparator that can be expanded to almost any length. It compares two 4-bit binary, BCD, or other monotonic codes and presents the three possible magnitude results at the outputs. The 4-bit inputs are weighted (A0A3) and (B0B3) where A3 and B3 are the most significant bits. The operation of the 74F85 is described in the Function Table, showing all possible logic conditions. The upper part of the table describes the normal operation under all conditions that will occur in a single device or in a series expansion scheme. In the upper part of the table the three outputs are mutually exclusive. In the lower part of the table, the outputs reflect the feed-forward conditions that exist in the parallel expansion scheme. The expansion inputs IA>B, and IA=B and IAB, A=B and AB, IA=B and IAB = Low, IA=B = High, and IA
A>B A=B A
SF00075
TYPE
TYPICAL PROPAGATION DELAY 7.0ns
TYPICAL SUPPLY CURRENT (TOTAL) 40mA
74F85
ORDERING INFORMATION
DESCRIPTION 16-pin plastic DIP 16-pin plastic SO COMMERCIAL RANGE VCC = 5V ±10%, Tamb = 0°C to +70°C N74F85N N74F85D PKG DWG # SOT38-4 SOT162-1
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS A0A3 B0B3 IAB AB DESCRIPTION Comparing inputs Comparing inputs Expansion inputs (active High) Data outputs (active High) 74F (U.L.) HIGH/LOW 1.0/0.033 1.0/0.033 1.0/0.033 50/33 LOAD VALUE HIGH/LOW 20µA/20µA 20µA/20µA 20µA/20µA 1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
10 12 13 15 9 11 14 1
IEC/IEEE SYMBOL
10 12 13 P 3 0 Q 3 PQ 7 6 5 0 COMP
A0 2 3 4 IAB
A1
A2
A3
B0
B1
B2
B3
15 9 11 14 1
A>B
A=B
A
2 3
VCC = Pin 16 GND = Pin 8
4 5 6 7
SF00076
SF00077
September 27, 1994
2
8530055 13903
Philips Semiconductors
Product specification
4-bit magnitude comparator
74F85
LOGIC DIAGRAM
A3 B3
15 1
5 A>B
A2 B2 IAB
13 14 2 3 4 12 11 6 A=B
A1 B1
7 A
A0 B0
10 9
VCC = Pin 16 GND = Pin 8
SF00078
FUNCTION TABLE
COMPARING INPUTS A3,B3 A3>B3 A3B2 A2B1 A1B0 A0B X X X X X X X X H L L X H L EXPANSION INPUTS IAB H L H L H L H L H L L L L H OUTPUTS A
A3=B3 A2=B2 H = High voltage level L = Low voltage level X = Don't care September 27, 1994
3
Philips Semiconductors
Product specification
4-bit magnitude comparator
74F85
APPLICATION
INPUTS (LSB) B23 A23 B22 A22 B21 A21 B20 A20 B19 L A19 B18 A18 B17 A17 B16 A16 B15 A15 B14 L A14 B13 A13 B12 A12 B11 A11 B10 A10 B9 L A9 B8 A8 B7 A7 B6 A6 B5 A5 B4 L A4 B3 A3 B2 A2 B1 A1 (LSB) B0 A0 L H L B3 A3 B2 A2 B1 A1 B0 A0 IAB B3 A3 B2 A2 B1 A1 B0 A0 IAB B3 A3 B2 A2 B1 A1 B0 A0 IAB B3 A3 B2 A2 B1 A1 B0 A0 IAB B3 A3 B2 A2 B1 A1 B0 A0 IAB AB AB NC AB NC B3 A3 B2 A2 B1 A1 B0 A0 AB AB OUTPUTS AB NC AB NC
The parallel expansion scheme shown in Figure 1 demonstrates the most efficient general use of these comparators. The expansion inputs can be used as a fifth input bit position except on the least significant device, which must be connected as in the serial scheme. The expansion inputs used by labeling IA>B as an "A" input, IA
Table 1.
WORD LENGTH 14 bits 524 bits 25120 bits NUMBER OF PACKAGES 1 26 831 TYPICAL SPEEDS 74F 12ns 22ns 34ns
SF00079
Figure 1. Comparison of Two 24-Bit Words
September 27, 1994
4
Philips Semiconductors
Product specification
4-bit magnitude comparator
74F85
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Tamb Tstg Supply voltage Input voltage Input current Voltage applied to output in High output state Current applied to output in Low output state Operating free-air temperature range Storage temperature range PARAMETER RATING 0.5 to +7.0 0.5 to +7.0 30 to +5 0.5 to VCC 40 0 to +70 65 to +150 UNIT V V mA V mA °C °C
RECOMMENDED OPERATING CONDITIONS
LIMITS SYMBOL VCC VIH VIL IIK IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free-air temperature range 0 PARAMETER MIN 4.5 2.0 0.8 18 1 20 +70 NOM 5.0 MAX 5.5 V V V mA mA mA °C UNIT
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 CONDITIONS VCC = MIN, VIL = MAX VIH = MIN, IOH = MAX Low-level output voltage output voltage Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Short-circuit output current3 ICCH ICC Supply current (total) ICCL VCC = MAX VCC = MIN, VIL = MAX VIH = MIN, IOL = MAX VCC = MIN, II = IIK VCC = 0.0V, VI = 7.0V VCC = MAX, VI = 2.7V VCC = MAX, VI = 0.5V VCC = MAX VIN = GND An = Bn = IA=B = GND, IA>B= IA
VOH
High-level output voltage output voltage
V
VOL VIK II IIH IIL IOS
NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last.
September 27, 1994
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