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Details, datasheet, quote on part number:N74F260D
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Datasheet text preview:
INTEGRATED CIRCUITS
74F260 Dual 5-input NOR gate
Product specification IC15 Data Handbook 1988 Nov 29
Philips Semiconductors
Philips Semiconductors
Product specification
Dual 5-input NOR gate
74F260
TYPE 74F260
TYPICAL PROPAGATION DELAY 3.5ns
TYPICAL SUPPLY CURRENT (TOTAL) 6mA
PIN CONFIGURATION
D0a D0b D0c 1 2 3 4 5 6 7 14 13 12 11 10 9 8 VCC Doe D0d D1d D1c D1b D1a
ORDERING INFORMATION
DESCRIPTION 14-pin plastic DIP 14-pin plastic SO COMMERCIAL RANGE VCC = 5V ±10%, Tamb = 0°C to +70°C N74F260N N74F260D PKG DWG # SOT27-1 SOT108-1
D1e Q0 Q1 GND
SF00829
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS Dna, Dnb, Dnc, Dnd, Dne Q0, Q1 Data inputs Data outputs DESCRIPTION 74F (U.L.) HIGH/LOW 1.0/1.0 50/33 LOAD VALUE HIGH/LOW 20µA/0.6mA 1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
LOGIC DIAGRAM
D0a 1 2 3 12 13 5
1
2
3
12
13
8
9
10
11
4
D0b D0c
Q0
D0a
D0b
D0c D0d
D0e D1a
D1b
D1c D1d
D1e
D0d D0e
Q0
Q1
D1a D1b
8 9 10 11 4 6 Q1
5 VCC = Pin 14 GND = Pin 7
6
D1c D1d
SF00830
VCC = Pin 14 GND = Pin 7
D1e
SF00832
IEC/IEEE SYMBOL FUNCTION TABLE
INPUTS
1 2 3 12 13 8 9 6 10 11 4 5
OUTPUT Dnd X X X H X L Dne X X X X H L Qn L L L L L H
1
Dna H X X X X L
Dnb X H X X X L
Dnc X X H X X L
H = High voltage level L = Low voltage level X = Don't care
SF00831
1988 Nov 29
2
8530048 95209
Philips Semiconductors
Product specification
Dual 5-input NOR gate
74F260
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Tamb Tstg Supply voltage Input voltage Input current Voltage applied to output in High output state Current applied to output in Low output state Operating free-air temperature range Storage temperature range PARAMETER RATING 0.5 to +7.0 0.5 to +7.0 30 to +5 0.5 to VCC 40 0 to +70 65 to +150 UNIT V V mA V mA °C °C
RECOMMENDED OPERATING CONDITIONS
LIMITS SYMBOL VCC VIH VIL IIK IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free-air temperature range 0 PARAMETER MIN 4.5 2.0 0.8 18 1 20 +70 NOM 5.0 MAX 5.5 V V V mA mA mA °C UNIT
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.) LIMITS SYMBOL PARAMETER
TAG TEST CONDITIONSNO TAG
MIN 2.5
TYP
NO TAG
MAX
UNIT
VOH
High-level output voltage output voltage
VCC = MIN, VIL = MAX VIH = MIN, IOH = MAX
±10%VCC ±5%VCC ±10%VCC ±5%VCC
V 2.7 3.4 0.30 0.30 0.73 0.50 V 0.50 1.2 100 20 0.6 60 150 4.6 7.3 6.5 9.5 V µA µA mA mA mA mA
VOL VIK II IIH IIL IOS ICC
Low-level output voltage output voltage Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Short-circuit output currentNO TAG Supply current (total) current (total) ICCH ICCL
VCC = MIN, VIL = MAX VIH = MIN, IOL = MAX VCC = MIN, II = IIK VCC = MAX, VI = 7.0V VCC = MAX, VI = 2.7V VCC = MAX, VI = 0.5V VCC = MAX VCC = MAX MAX
VIN=GND VIN=4.5V
NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last.
1988 Nov 29
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