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Details, datasheet, quote on part number:74LVX16245TTR
 
 
Part:74LVX16245TTR
Category:Logic => LVX->HCMOS, 5V Input Tolerant->Low Voltage, Low No
Description:16-BIT Bus Transceiver With 3-STATE Outputs, 5V Tolerant Inputs
Company:ST Microelectronics, Inc.
Datasheet:Download 74LVX16245TTR datasheet   File size : 254 kB
Request For quote:  Find where to buy 74LVX16245TTR
 



Datasheet text preview:
74LVX16245
16-BIT BUS TRANSCEIVER WITH 3-STATE OUTPUTS, 5V TOLERANT INPUTS
s s s

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H IGH SPEED: tPD = 5.3 ns (TYP.) at VCC = 3V 5V TOLERANT INPUT LOW POWER DISSIPATION: ICC = 4 µA (MAX.) at TA=25°C INPUT VOLTAGE LEVEL: VIL= 0.8, VIH=2V AT VCC=3V POWER DOWN PROTECTION ON INPUTS & OUTPUTS SYMMETRICAL OUTPUT IMPED ANCE: |IOH| = IOL = 4 mA (MIN) BALANCED PROPAGATION DELAYS: tPLH tPHL OPERATING VOLTAGE RANGE: VCC(OPR) = 2V to 3.6V (1.2V Data Retention) IMPROVED LATC H-U P IMMUNITY LOW NOISE: VOLP = 0.3V (TYP.) AT Vcc=3V

TSSOP

O RDE R CO DE S
PACKAGE TSSOP TUBE T&R 74LVX16245TTR

PIN CONNECTION

DESCRIPTION The 74LVX16245 is an advanced high-speed CMOS 16-BIT BU S TRANSCEIVER (3-STATE) fabricated with sub-micron silicon gate and double-layer metal wiring C2MOS technology. This IC is intended for two-way asynchronous communication between data busses; the direction of data transmission is determined by DIR input. The enable input G can be used to disable the device so that the busses are effectively isolated. All inputs and outputs are equipped with protection circuits against static discharge, giving them 2KV ESD immunity and transient excess voltage. All floating bus terminals during High Z State must be held HIGH or LOW .

July 2003

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74LVX16245
INPUT EQUIVALENT CIRCUIT IEC LOGIC SYMBOLS

PIN DESCRIPTION
PIN No 1 2, 3, 5, 6, 8, 9, 11, 12 13, 14, 16, 17, 19, 20, 22, 23 24 25 36, 35, 33, 32, 30, 29, 27, 26 47, 46, 44, 43, 41, 40, 38, 38 48 4, 10, 15, 21, 28, 34, 39, 45 7, 18, 31, 42 SYMBOL NAME AND FUNCTION

1DIR Directional Control 1B1 to 1B8 Data Inputs/Outputs 2B1 to 2B8 Data Inputs/Outputs 2DIR Directional Control 2G Output Enable Input 2A1 to 2A8 Data Inputs/Outputs 1A1 to 1A8 Data Inputs/Outputs 1G GND VC C Output Enable Input Ground (0V) Positive Supply Voltage

TRUTH TABLE
INPUTS G L L H DIR L H X FUNCTION A BUS B BUS OUTPUT Yn A=B B=A Z

OUTPUT INPUT INPUT OUTPUT Z Z

X : Don`t Care Z : High Impedance

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74LVX16245
AB SOLUTE MAXIMUM RATINGS
Symbol VCC VI VI/O VO IIK IOK IO Supply Voltage DC Input Voltage (DIR, G) Bus I/O Voltage DC Output Voltage DC Input Diode Current DC Output Diode Current DC Output Current Parameter Value -0.5 to +7.0 -0.5 to +7.0 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 - 20 ± 20 ± 25 ± 75 -65 to +150 300 Unit V V V V mA mA mA mA °C °C

ICC or IGND DC VCC or Ground Current Storage Temperature Tstg TL Lead Temperature (10 sec)

Absolute Maximum Ratings are those values beyond which damage to the device may occur. F unctional operation under these conditions is not implied

RECOMMENDED OPERA TING CONDITIONS
Symbol VCC VI VI/O VO Top dt/dv Supply Voltage (note 1) Input Voltage (DIR, G) Bus I/O Voltage Output Voltage Operating Temperature Input Rise and Fall Time (note 2) (VCC = 3.0) Parameter Value 2 to 3.6 0 to 5.5 0 to VCC 0 to VCC -55 to 125 0 to 100 Unit V V V V °C ns/V

1) Truth T able guaranteed: 1.2 to 3.6V 1) VIN from 0.8 to 2.0V

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74LVX16245
DC SPEC IFICATIONS
Test Condition Symbol Parameter V CC (V) 2.0 3.0 3.6 2.0 3.0 3.6 2.0 3.0 3.0 VOL Low Level Output Voltage 2.0 3.0 3.0 Ioz High Impedance Output Leakage Current Input Leakage Current Quiescent Supply Current 5.5 0 to 5.5 5.5 IO=-50 µA IO=-50 µA IO=-4 mA IO=50 µA IO=50 µA IO=4 m VI = VIH or VIL VO = VCC or GND VI = 5.5V or GND VI = VCC or GND TA = 25°C Min. 1.5 2.0 2.4 0.5 0.8 0.8 1.9 2.9 2.58 2.0 3.0 4.5 0.0 0.0 0.1 0.1 0.36 ±0.25 ± 0.1 4 1.9 2.9 2.48 0.1 0.1 0.44 ± 2.5 ±1 40 0.55 ± 2.5 ±1 40 µA µA µA V Typ. Max. Value -40 to 85°C Min. 1.5 2.0 2.4 0.5 0.8 0.8 1.9 2.9 2.4 V Max. -55 to 125°C Min. 1.5 2.0 2.4 0.5 0.8 0.8 Max. V Unit

VIH

High Level Input Voltage Low Level Input Voltage High Level Output Voltage

VIL

V

VOH

II ICC

AC ELECTRICAL C HARACTERISTICS (Input tr = tf = 3ns)
Test Condition Symbol Parameter V CC (V) 2.7 2.7 3.3(*) 3.3(*) t P ZL tPZH Output Disable Time 2.7 2.7 3.3 tPLZ tPHZ tOSLH tOSHL
(*)

Value TA = 25°C Min. Typ. 5.7 8.0 5.3 7.8 Max. 9.0 12.3 8.4 11.9 11.0 15.1 10.6 14.1 15.0 14.0 1.5 1.0 -40 to 85°C Min. 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 Max. 10.5 14.0 10.0 13.5 13.5 16.5 12.5 16.0 16.5 16.0 1.5 1.0 -55 to 125°C Min. 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 Max. 10.5 14.0 10.0 13.5 13.5 16.5 12.5 16.0 16.5 16.0 1.5 1.0 ns ns ns ns Unit

CL (pF) 15 50 15 50 15 50 15 50 50 50 50 50 RL = 1K R L = 1 K RL = 1K RL = 1K RL = 1K RL = 1K

tPLH tPHL

Propagation Delay Time

7.0 9.6 6.6 9.1 10.8 10.3

3.3(*) Output Enable Time Output to Output Skew time (note 1) 2.7 3.3(*) 3.3(*) 3.3
(*)

(*) Voltage range is 3.3V ± 0.3V Note 1: Parameter guaranteed by design. tsoLH = |tpLHm - tpLHn|, tsoHL = |tpHLm - tpHLn|

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74LVX16245
CA PACITIVE CHARA CTERISTICS
Test Condition Symbol Parameter Min. CIN CI/O CPD Input Capacitance Output Capacitance Power Dissipation Capacitance (note 1) TA = 25°C Typ. 4 8 21 Max. 10 Value -40 to 85°C Min. Max. 10 -55 to 125°C Min. Max. 10 pF pF pF Unit

1) CPD is defined as the value of the IC's internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/8 (per circuit)

DYNAMIC SWITCH ING CHARA CTERISTICS
Test Condition Symbol Parameter V CC (V) 3.3 TA = 25°C Min. Typ. 0.3 -0.8 CL = 50 pF 2.0 -0.3 Max. 0.8 V Value -40 to 85°C Min. Max. -55 to 125°C Min. Max. Unit

VOLP VOLV VIHD

VILD

Dynamic Low Voltage Quiet Output (note 1, 2) Dynamic High Voltage Input (note 1, 3) Dynamic Low Voltage Input (note 1, 3)

3.3

V

3.3

0.8

V

1) Worst case package. 2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V, (n-1) outputs switching and one output at GND. 3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (V ILD), 0V to threshold (VIHD), f=1MHz.

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