Details, datasheet, quote on part number: M28C64-A15KA6T
CategoryDiscrete => Diodes & Rectifiers => Protection
Description64 Kbit 8k X 8 Parallel EePROM With Software Data Protection
CompanyST Microelectronics, Inc.
DatasheetDownload M28C64-A15KA6T datasheet


Features, Applications
64 Kbit x 8) Parallel EEPROM With Software Data Protection

Low Power Consumption Fast BYTE and PAGE WRITE (up to 64 Bytes) VCC=4.5 V for VCC=4.5 V for VCC=2.7 V for M28C64-xxW

Enhanced Write Detection and Monitoring: Ready/Busy Open Drain Output Data Polling Toggle Bit Page Load Timer Status

JEDEC Approved Bytewide Pin-Out Software Data Protection 100000 Erase/Write Cycles (minimum) Data Retention (minimum): 40 Years for M28C64 and 10 Years for M28C64-A

G RB VCC VSS Address Input Data Input / Output Write Enable Chip Enable Output Enable Ready / Busy Supply Voltage

DESCRIPTION The M28C64 devices consist of 8192x8 bits of low power, parallel EEPROM, fabricated with STMicroelectronics' proprietary single polysilicon CMOS technology. The devices offer fast access time, with low power dissipation, and require a single voltage supply or 3V, depending on the option chosen). The device has been designed to offer a flexible microcontroller interface, featuring both hardware

and software handshaking, with Ready/Busy, Data Polling and Toggle Bit. The device supports a 64 byte Page Write operation. Software Data Protection (SDP) is also supported, using the standard JEDEC algorithm.

Symbol TA T STG VCC VIO VI VESD Parameter Ambient Operating Temperature Storage Temperature Supply Voltage Input or Output Voltage Input Voltage Electrostatic Discharge Voltage (Human Body model) 2 Value 6.5 4000 Unit C

Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the ST SURE Program and other relevant quality documents. 3015.7 (100 pF, 1500 )



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