Details, datasheet, quote on part number: 74AC11002
Part74AC11002
CategoryLogic => Gates => CMOS/BiCMOS->AC/ACT Family
TitleCMOS/BiCMOS->AC/ACT Family
DescriptionQuadruple 2-input Positive-nOR GATE
CompanyTexas Instruments, Inc.
DatasheetDownload 74AC11002 datasheet
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Features, Applications

Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Configuration Minimizes High-Speed Switching Noise EPIC TM (Enhanced-Performance Implanted CMOS) 1-m Process 500-mA Typical Latch-Up Immunity at 125C Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs

description

These devices contain four independent 2-input NOR gates. They perform the Boolean functions or in positive logic. The 54AC11002 is characterized for operation over the full military temperature range to 125C. The 74AC11002 is characterized for operation from to 85C.

FUNCTION TABLE (each gate) INPUTS OUTPUT

This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, J, and N packages.

PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)

Supply voltage range, VCC. 7 V Input voltage range, VI (see Note V to VCC 0.5 V Output voltage range, VO (see Note V to VCC 0.5 V Input clamp current, IIK (VI VI > VCC). 20 mA Output clamp current, IOK (VO VO > VCC). 50 mA Continuous output current, IO (VO 0 to VCC). 50 mA Continuous current through VCC or GND. 100 mA Storage temperature range. to 150C

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

54AC11002 MIN VCC VIH Supply voltage High-level input voltage VCC 3 V VCC 4.5 V VCC 5.5 V VCC 3 V VIL VI VO IOH Low-level input voltage Input voltage Output voltage High-level output current VCC 3 V VCC 4.5 V VCC 5.5 V VCC 3 V IOL /v TA Low-level output current Input transition rise or fall rate Operating free-air temperature VCC 4.5 V VCC 55 VCC 4.5 V VCC 5.5 V VCC NOM 5 MAX 5.5 74AC11002 MIN VCC ns/ C mA NOM 5 MAX 5.5 UNIT V

electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)

VI = VCC or GND 5V 3.5 Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.

switching characteristics over recommended operating free-air temperature range, VCC 0.3 V (unless otherwise noted) (see Figure 1)

PARAMETER tPLH tPHL FROM (INPUT) B TO (OUTPUT) = 25C MIN TYP MAX 54AC11002 MIN 1.5 MAX 9 74AC11002 MIN 1.5 MAX 9.9 8.4 UNIT ns

switching characteristics over recommended operating free-air temperature range, VCC 0.5 V (unless otherwise noted) (see Figure 1)

PARAMETER tPLH tPHL FROM (INPUT) B TO (OUTPUT) = 25C MIN TYP MAX 54AC11002 MIN 1.5 MAX 6.8 74AC11002 MIN 1.5 MAX 6.9 6.4 UNIT ns

PARAMETER Cpd Power dissipation capacitance per gate TEST CONDITIONS = 50 pF, = 1 MHz TYP 32 UNIT pF


 

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