q SAMPLING FREQUENCY (fS): q 8X OVERSAMPLING 96kHz q INPUT AUDIO DATA WORD: 24-Bit q HIGH PERFORMANCE: Dynamic Range: K Grade = 112dB typ SNR: 120dB typ THD+N: K Grade = 0.0008% typ q FAST CURRENT OUTPUT: ±1.2mA/200ns q GLITCH-FREE OUTPUT q PIN-PROGRAMMABLE DATA INVERSION q POWER SUPPLY: ±5V q SMALL 20-LEAD SO PACKAGE

The is a precision, 24-bit digital-to-analog converter with exceptionally high dynamic performance. The ultra-low distortion and excellent lowlevel signal performance makes the PCM1704 an ideal candidate for high-end consumer and professional audio applications. When used with a digital interpolation filter, the PCM1704 supports 8X oversampling at 96kHz. The PCM1704 incorporates a BiCMOS sign-magnitude architecture that eliminates glitches and other nonlinearities around bipolar zero. The PCM1704 is precision laser-trimmed at the factory to minimize differential linearity and gain errors. In addition to high performance audio systems, the PCM1704 is well-suited to waveform synthesis applications requiring very low distortion and noise.

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All specifications = +25°C, ±VCC = ±VDD (96kHz· 8), and 24-bit data, unless otherwise noted. PCM1704U PARAMETER RESOLUTION DATA FORMAT Audio Data Interface Format Audio Data Code Sampling Frequency (fS) Input Clock Frequency DIGITAL INPUT/OUTPUT Input Logic Level: VIH(2) VIL(2) Input Logic Current: IIH(2) IIL(2) DYNAMIC PERFORMANCE(3) THD+N = 0dB CONDITIONS MIN TYP 20-, 24-Bit, MSB-First Binary Two's Complement 96 25 kHz MHz MAX UNITS Bits

Signal-to-Noise Ratio Low Level Linearity DC ACCURACY Gain Error Bipolar Zero Error Gain Drift Bipolar Zero Error Drift ANALOG OUTPUT Output Range Output Impedance Settling Time POWER SUPPLY REQUIREMENTS Voltage Range: +VCC = +VDD ­VCC = ­VDD Combined Supply Current:+ICC ­ICC TEMPERATURE RANGE Operation Storage

NOTES: (1) BCLK, WCLK, DATA. (2) 20BIT, INVERT. (3) Dynamic performance data is tested with 5534 I/V amp with 7.5k feedback resistor. THD+N data is tested by Shibasoku 725C with 30kHz external LPF, 400Hz HPF, average mode. Input signal frequency = 1.1kHz.

PIN 1 2 NAME DATA BCLK NC ­VDD DGND +VDD WCLK NC 20BIT INVERT +VCC BPO DC NC IOUT AGND SERVO DC NC REF DC ­VCC I/O IN OUT FUNCTION Serial Audio Data Input. Bit Clock Input for Serial Audio Data. No Connection. Digital Power, ­5V. Digital Ground. Digital Power, +5V. Data Latch Enable Input. No Connection. Input Data Word Selection(1). Input Data Polarity Selection(1). Analog Power, +5V. Bipolar Offset Decoupling Capacitor. No Connection. Current Output for Audio Signal. Analog Ground. Analog Ground. Servo Amplifier Decoupling Capacitor. No Connection. Band Gap Reference Decoupling Capacitor. Analog Power, ­5V.

NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book.

Supply Voltage, +VDD ,+VCC............................................................. +6.5V Supply Voltage Differences.............................................................. ±0.1V GND Voltage Differences................................................................. ±0.1V Digital Input Voltage (BCLK, WCLK, DATA)............................ DGND ­0.3V to (+VDD 0.3V) (20BIT, INVERT).................................... ­VDD 0.3V to (DGND + 0.3V) Input Current (any pins except supply pins)................................... ±10mA Power Dissipation.......................................................................... 300mW Operating Temperature Range......................................... to +85°C Storage Temperature...................................................... to +125°C Lead Temperature (soldering, 5s)................................................. +260°C Package Temperature (reflow, 10s).............................................. +235°C

This integrated circuit can be damaged by ESD. Burr-Brown recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.