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Details, datasheet, quote on part number:SN54ABTH18502AHV
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Datasheet text preview:
SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E AUGUST 1993 REVISED DECEMBER 1996
D D D D D D D
Members of the Texas Instruments SCOPE TM Family of Testability Products Members of the Texas Instruments Widebus TM Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT TM (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors B-Port Outputs of 'ABTH182502A Devices Have Equivalent 25- Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-B TM BiCMOS Design
D D
D
One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency SCOPE Instruction Set IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ Parallel-Signature Analysis at Inputs Pseudo-Random Pattern Generation From Outputs Sample Inputs/Toggle Outputs Binary Count From Outputs Device Identification Even-Parity Opcodes Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings
SN54ABTH18502A, SN54ABTH182502A . . . HV PACKAGE (TOP VIEW)
1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 NC VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6
1A2 1A1 1OEAB GND 1LEAB 1CLKAB TDO VCC NC TMS 1CLKBA 1LEBA 1OEBA GND 1B1 1B2 1B3
987 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6 5 4 3 2 1 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45
26 44 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
1B4 1B5 1B6 GND 1B7 1B8 1B9 VCC NC 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7
2A7 2A8 2A9 GND 2OEAB 2LEAB 2CLKAB TDI NC
NC No internal connection
VCC
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, UBT, and EPIC-B are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303
TCK 2CLKBA 2LEBA GND 2OEBA 2B9 2B8
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.
· DALLAS, TEXAS 75265
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SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E AUGUST 1993 REVISED DECEMBER 1996
SN74ABTH18502A, SN74ABTH182502A . . . PM PACKAGE (TOP VIEW)
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6
1A 2 1A 1 1OEAB GND 1 LE A B 1 C LK A B TD O V CC TMS 1 C LK B A 1 LE B A 1OEBA GND 1B 1 1B 2 1B 3
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33
1B4 1B5 1B6 GND 1B7 1B8 1B9 VCC 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7
description
The 'ABTH18502A and 'ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When OEAB is low, the B outputs are active. When OEAB is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs. In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
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2A7 2A8 2A9 GND 2OEAB 2LEAB 2CLKAB TDI VCC TCK 2CLKBA 2LEBA GND 2OEBA 2B9 2B8
POST OFFICE BOX 655303
· DALLAS, TEXAS 75265
SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E AUGUST 1993 REVISED DECEMBER 1996
description (continued)
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful. Active bus-hold circuitry holds unused or floating data inputs at a valid logic level. The B-port outputs of 'ABTH182502A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot. The SN54ABTH18502A and SN54ABTH182502A are characterized for operation over the full military temperature range of 55°C to 125°C. The SN74ABTH18502A and SN74ABTH182502A are characterized for operation from 40°C to 85°C.
FUNCTION TABLE (normal mode, each register) INPUTS OEAB L L L L L H LEAB L L L H H X CLKAB L X X X A X L H L H X OUTPUT B B0 L H L H
Z A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA, LEBA, and CLKBA. Output level before the indicated steady-state input conditions were established
POST OFFICE BOX 655303
· DALLAS, TEXAS 75265
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