Details, datasheet, quote on part number: TC74AC521
CategoryLogic => Counters => CMOS/BiCMOS->AC/ACT Family
DescriptionCMOS Dual Binary Counter
CompanyToshiba America Electronic Components, Inc.
DatasheetDownload TC74AC521 datasheet
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Features, Applications

Features: High Speed: tpd = 6.4ns (typ.) at VCC = 5V Low Power Dissipation: ICC = 8A (max.) = 25C* High Noise Immunity: VNIH = VNIL = 28% VCC (min.) Symmetrical Output Impedance: IOH = IOL = 24mA (min.). Capability of driving 50 transmission lines. Balanced Propagation Delays: tpLH = tpHL Wide Operating Voltage Range: VCC (opr) = 2V~5.5V Pin and Function Compatible with 74F521 Available in DIP, SOIC and SOP Packages The TC74AC520 and TC74AC521 are advanced high speed CMOS 8-BIT DIGITAL COMPARATORS fabricated with silicon gate and double-layer metal wiring C2MOS technology. They achieve the high speed operation similar to equivalent Bipolar Schottky TTL, while maintaining the CMOS low power dissipation. They compare two 8-bit binary or BCD words applied inputs P0~P7, and inputs Q0~Q7, and indicate whether or not they are equal. The TC74AC520 is equipped with pull-up resistors (20 typ.) to inputs Q0~Q7 and features pull-up resistors on the Q inputs for switch data. A signal active low enable is provided to facilitate cascading of several packages to compare words greater than 8 bits. All inputs are equipped with protection circuits against static discharge or transient excess voltage. IEC Logic Symbol

The information contained here is subject to change without notice. The information contained herein is presented only as guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others. These TOSHIBA products are intended for usage in general electronic equipments (office equipment, communication equipment, measuring equipment, domestic electrification, etc.) Please make sure that you consult with us before you use these TOSHIBA products in equipments which require high quality and/or reliability, and in equipments which could have major impact to the welfare of human life (atomic energy control, spaceship, traffic signal, combustion control, all types of safety devices, etc.). TOSHIBA cannot accept liability to any damage which may occur in case these TOSHIBA products were used in the mentioned equipments without prior consultation with TOSHIBA.

PARAMETER Supply Voltage Range DC Input Voltage DC Output Voltage Input Diode Current Output Diode Current DC Output Current DC VCC/Ground Current Power Dissipation Storage Temperature Lead Temperature 10sec SYMBOL VCC VIN VOUT IIK IOK IOUT ICC PD Tstg TL VALUE 0.5 -0.5~VCC (DIP) */180 (SOP) -65~150 300 UNIT 500mW in the range = -40C~65C. From 85C a derating factor of -10mW/C should be applied to 300mW.

PARAMETER Supply Voltage Input Voltage Output Voltage Operating Temperature Input Rise and Fall Time SYMBOL VCC VIN VOUT Topr dt/dv VALUE -40~85 0~100 (VCC 3.30.3V) 0~20 (VCC = 50.5V) UNIT V C ns/v

PARAMETER SYMBOL TEST CONDITION VCC 2.0 High-Level Input Voltage VIH 5.5 2.0 Low-Level Input Voltage VIL 5.5 2.0 IOH = -50A High-Level Output Voltage VOH VIN = VIH or VIL IOH = -4mA IOH = -24mA IOH = -75mA* IOL = 50A Low-Level Output Voltage VOL VIN = VIH or VIL IOL =12mA IOL = 24mA IOL 75mA* * This spec indicates the capability of driving 50 transmission lines. One output should be tested at a time for a 10ms maximum duration. Min. = 25C Typ. Max. = -40~85C Min. Max. UNIT

P3 Q3 P=Q Note: AC520 is equipped with pull-up resistors (20k typ.) to inputs Q4 P4

PARAMETER SYMBOL TEST CONDITION VCC Input Leakage Current High-Level Input Current Low-Level Input Current IIN IIH IIL P and G inputs only VIN = VCC or GND Q inputs only VIN = VCC Q inputs only VIN = GND Q inputs open P and G inputs, VIN = VCC or GND Q inputs, VIN = GND P and G inputs, VIN = VCC or GND Min. = 25C Typ. 0.3 Max. = -40~85C Min. Max. mA A UNIT

PARAMETER Input Leakage Current Quiescent Supply Current SYMBOL IIN ICC TEST CONDITION VCC VIN = VCC or GND VIN = VCC or GND 5.5 Min. = 25C Typ. Max. = -40~85C Min. Max. 80.0 A UNIT

PARAMETER Propagation Delay Time (Pn, QnP=Q) Propagation Delay Time (GP=Q) Input Capacitance Power Dissipation Capacitance SYMBOL tpLH tpHL tpLH tpHL CIN CPD1 TEST CONDITION VCC Min. = 25C Typ. Max. = -40~85C Min. Max. pF ns UNIT

Note (1): CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD VCC fIN + ICC.


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